United States Patent
US Patent 4633082: Process for measuring degradation of sulfur…
US 4633082 · granted 1986-12-30
Abstract
This invention is a method of detecting the presence of toxic and corrosive by-products in high voltage systems produced by electrically induced degradation of SF.sub.6 insulating gas in the presence of certain impurities. It is an improvement over previous methods because it is extremely sensitive, detecting by-products present in parts per billion concentrations, and because the device employed is of a simple design and takes advantage of the by-products natural affinity for fluoride ions. The method employs an ion-molecule reaction cell in which negative ions of the by-products are produced by fluorine attachment. These ions are admitted to a negative ion mass spectrometer and identified by their spectra. This spectrometry technique is an improvement over conventional techniques because the negative ion peaks are strong and not obscured by a major ion spectra of the SF.sub.6 component as is the case in positive ion mass spectrometry.
| Patent Number | 4633082 |
|---|---|
| Title | Process for measuring degradation of sulfur hexafluoride in high voltage systems |
| Filed | 1985-04-23 |
| Granted | 1986-12-30 |
| Inventor(s) | Sauers; Isidor |
| Assignee | The United States of America as represented by the United States |
| Number of Claims | 7 |
Abstract
This invention is a method of detecting the presence of toxic and corrosive by-products in high voltage systems produced by electrically induced degradation of SF.sub.6 insulating gas in the presence of certain impurities. It is an improvement over previous methods because it is extremely sensitive, detecting by-products present in parts per billion concentrations, and because the device employed is of a simple design and takes advantage of the by-products natural affinity for fluoride ions. The method employs an ion-molecule reaction cell in which negative ions of the by-products are produced by fluorine attachment. These ions are admitted to a negative ion mass spectrometer and identified by their spectra. This spectrometry technique is an improvement over conventional techniques because the negative ion peaks are strong and not obscured by a major ion spectra of the SF.sub.6 component as is the case in positive ion mass spectrometry.
Claim 1
A process for detecting by-products from electrically induced degradation of SF.sub.6 in high voltage systems comprising: at a pressure within said reaction cell sufficient to cause electron attachment to SF.sub.6, placing an SF.sub.6 gas to be tested in an ion-molecule reaction cell having a cathode at a first end, an anode opposite said cathode at a second end, apin hole aperture incorporated into said anode that opens into a negative ion mass spectrometer that is at a lower pressure than is said reaction cell; producing thermal electrons at said cathode thereby ionizing molecules of said SF.sub.6 gas in the vicinity of said cathode to form SF.sub.6.sup.- ions; applying an electrical field in said reaction cell to induce the transfer of said SF.sub.6.sup.- ions from said cathode to said anode resulting in the formation of by-product ions from intervening by-product molecules having a high affinity forfluoride ions; introducing a combination of said SF.sub.6.sup.- ions and said by-product ions into said pin hole aperture thereby effecting flow of said combination of ions from said reaction cell to said negative ion mass spectrometer; and detecting said by-product ions using negati
Claims
7 totalA process for detecting by-products from electrically induced degradation of SF.sub.6 in high voltage systems comprising: at a pressure within said reaction cell sufficient to cause electron attachment to SF.sub.6, placing an SF.sub.6 gas to be tested in an ion-molecule reaction cell having a cathode at a first end, an anode opposite said cathode at a second end, apin hole aperture incorporated into said anode that opens into a negative ion mass spectrometer that is at a lower pressure than is said reaction cell; producing thermal electrons at said cathode thereby ionizing molecules of said SF.sub.6 gas in the vicinity of said cathode to form SF.sub.6.sup.- ions; applying an electrical field in said reaction cell to induce the transfer of said SF.sub.6.sup.- ions from said cathode to said anode resulting in the formation of by-product ions from intervening by-product molecules having a high affinity forfluoride ions; introducing a combination of said SF.sub.6.sup.- ions and said by-product ions into said pin hole aperture thereby effecting flow of said combination of ions from said reaction cell to said negative ion mass spectrometer; and detecting said by-product ions using negati