Resources Contact Us Home
Process to reduce pilling of polyester knit fabrics
T995001 Process to reduce pilling of polyester knit fabrics
Patent Drawings:

Inventor: Bass
Date Issued: June 3, 1980
Application: 06/069,232
Filed: August 23, 1979
Inventors: Bass; Stephen (Wilmington, DE)
Primary Examiner:
Assistant Examiner:
Attorney Or Agent:
U.S. Class: 8/139
Field Of Search:
International Class:
U.S Patent Documents:
Foreign Patent Documents:
Other References:

Abstract: The pilling propensity of knit fabric from polyester staple fiber can be reduced by scouring the fabric at a temperature in the range of about to F. for from about 15 to 60 minutes in a 0.3 to 1.0% aqueous caustic solution containing about 0.001 to 0.1% of a quaternary ammonium salt of the formula: ##STR1## wherein R is an alkylene radical of 2 to 3 carbon atoms, R' is H or phenyl, R" is a C.sub.12 -C.sub.18 hydrocarbon radical, x is 2 or 3, y is 0 to 3, and Z.sup.- is an anion, preferably the dimethyl sulfate quaternary ammonium salt of bis(hydroxy-tri-1,2-propyleneoxy-2-ethyl)tallowamine. After scouring, the fabric is normally rinsed, neutralized, rinsed again and dried.
  Recently Added Patents
Method for transmitting an electronic short message to multiple receivers
System and method for detecting malicious code executed by virtual machine
Voltage generating system and memory device using the same
Graphical communication user interface with graphical position user input mechanism for selecting a display image
Methods, systems, and products for providing communications services
Method for forming contact in an integrated circuit
Semiconductor device and method for fabricating the same
  Randomly Featured Patents
NaOH production from ceramic electrolytic cell
Method for cleaning a washing device of an offset printing machine
CMOS image sensor and manufacturing method thereof
Solar collector
Process for preparing epoxides
Vulcanizable polymer mixtures, their production and use and vulcanizates obtained therefrom
Optical devices with electron-beam evaporated multilayer mirror
Canopy system
Method of inspecting chip defects
Field effect transistors having multiple stacked channels