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Monolithically integrated semiconductor structure containing at least two devices in a common zone and technique for preventing parasitic transistor action
T969010 Monolithically integrated semiconductor structure containing at least two devices in a common zone and technique for preventing parasitic transistor action

Patent Drawings:
Inventor: Berger, et al.
Date Issued: April 4, 1978
Application: 05/801,433
Filed: May 20, 1977
Inventors: Berger; Horst H. (Sindelfingen, DT)
Wiedmann; Siegfried K. (Stuttgart, DT)
Assignee: International Business Machines Corporation (Armonk, NY)
Primary Examiner:
Assistant Examiner:
Attorney Or Agent:
U.S. Class: 257/477; 257/517; 257/547; 257/577; 257/E27.04; 257/E29.034
Field Of Search:
International Class:
U.S Patent Documents:
Foreign Patent Documents:
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Abstract: to prevent a parasitic lateral transistor or thyristor effect in an integrated structure including a transistor and a further device sharing one common zone, a doped region which is more highly doped with regard to the common zone and which simultaneously constitutes a contact region is arranged between the components to be separated. This separating and contact region acts as a barrier reflecting an undesired minority carrier current flow injected from the further device. In the preferred embodiment, the transistor structure is a bipolar transistor and the further semiconductor device is a Schottky diode integrated into the collector zone of the bipolar transistor.
Claim:
Description:
 
 
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