Resources Contact Us Home
Back strengthening machine
D615138 Back strengthening machine
Patent Drawings:

Inventor: Briscoe
Date Issued: May 4, 2010
Application: D/313,962
Filed: February 23, 2009
Inventors: Briscoe; Betty Jane (Freeport, NY)
Assignee: Briscoe; Betty Jane (Freeport, NY)
Primary Examiner: Spear; Robert M
Assistant Examiner: Underwood; Cynthia
Attorney Or Agent:
U.S. Class: D21/686; D21/662
Field Of Search: D21/687; D21/686; D21/662; D21/694; D21/692; D21/797; D21/689; D21/698; D21/788; 482/124; 482/125; 482/129; 482/142; 482/137; 482/96; 482/97; 482/93; 248/121; 248/125.1; 297/461
International Class: 2102
U.S Patent Documents:
Foreign Patent Documents:
Other References:

Claim: CLAIM The ornamental design for a back strengthening machine, as shown and described.
Description: The single FIGURE is a left side perspective view showing my new design, the oblique shaded lines representing rubber, the right side being a mirror image thereof.

The broken lines represent portions of the structure that form no part of the claim.

* * * * *
  Recently Added Patents
Memory device having collaborative filtering to reduce noise
Contactless electrical connector for an induction sensor, and sensor including such a connector
Gate timing for short servo wedge in disk memory systems
Liquid crystal display and manufacturing method thereof
Exposure method, exposure apparatus, and method for producing device
Soybean cultivar BY0811143
  Randomly Featured Patents
Method, apparatus, and recording medium for image composition
Programmable thermostat
Configuration tracking system
Method for treating water by advanced oxidation and ballasted flocculation, and corresponding treatment plant
Windshield washing system, especially for motor vehicles
Fluid dynamic bearing device
Heat exchanger with mechanical turbulator
Method and apparatus for minimizing seek time in a disk drive by increasing power amplifier power based on power amplifier voltage head room
Rooting method for vegetative plant propagation of hard-to-root plants
Method for resistance measurements on a semiconductor element with controlled probe pressure