| |
 |
Testing device for electronic component |
| D573049 |
Testing device for electronic component
|
|
| Patent Drawings: | |
| Inventor: |
Chen, et al. |
| Date Issued: |
July 15, 2008 |
| Application: |
D/275,496 |
| Filed: |
December 28, 2006 |
| Inventors: |
Chen; Chin-Feng (Taipei Hsien, TW)
Fan; Chiou-Lin (Taipei Hsien, TW)
Huang; Ying-Chih (Taipei Hsien, TW)
Lin; Tay-Yang (Taipei Hsien, TW)
|
| Assignee: |
Hon Hai Precision Industry Co., Ltd. (Tu-Cheng, Taipei Hsien, TW) |
| Primary Examiner: |
Davis; Antoine D |
| Assistant Examiner: |
|
| Attorney Or Agent: |
Chung; Wei Te |
| U.S. Class: |
D10/75 |
| Field Of Search: |
D10/46; D10/75; D10/76; D10/77; 73/7; 324/158.1; 324/210; 324/212; 360/106; 360/31; 369/223 |
| International Class: |
1004 |
| U.S Patent Documents: |
|
| Foreign Patent Documents: |
|
| Other References: |
|
|
| Abstract: |
|
| Claim: |
CLAIM The ornamental design for a testing device for electronic component, substantially as shown and described. |
| Description: |
FIG. 1 is a perspective view of a testing device for electronic component in accordance with the present design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a left side elevational view thereof;
FIG. 5 is a right side elevational view thereof;
FIG. 6 is a top plan view thereof; and,
FIG. 7 is a perspective view thereof, with a display screen in an open position and a drawer being drawn out.
(Broken line portions are only included to show the intended use environment and do not constitute a part of the claimed design.)
* * * * * |
|
|
|
