Resources Contact Us Home Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE     Putter head D559929 Putter head Patent Drawings: Inventor: Cameron Date Issued: January 15, 2008 Application: D/269,900 Filed: December 11, 2006 Inventors: Cameron; Don T. (Carlsbad, CA) Assignee: Acushnet Company (Fairhaven, MA) Primary Examiner: Siegel; Mitchell I Assistant Examiner: Attorney Or Agent: Wheeler; Kristin D. U.S. Class: D21/736 Field Of Search: D21/736; D21/737; D21/738; D21/739; D21/740; D21/741; D21/742; D21/743; D21/744; D21/745; D21/746; 473/324; 473/325; 473/326; 473/327; 473/328; 473/329; 473/330; 473/331; 473/340; 473/341; 473/251; 473/252; 473/253; 473/254; 473/255; 473/256 International Class: 2102 U.S Patent Documents: Foreign Patent Documents: Other References: Abstract: Claim: CLAIM The ornamental design for a putter head, as shown and described. Description: FIG. 1 is a top perspective view of my new design for a putter head. FIG. 2 is a top view thereof; FIG. 3 is a heel side view thereof; FIG. 4 is a toe side view thereof; FIG. 5 is a back view thereof; FIG. 6 is a bottom view thereof; and, FIG. 7 is a front view thereof. * * * * *       Recently Added Patents Method of manufacturing multilayer wiring board P-wave anisotropy determination using borehole measurements Gel polymers containing ionic liquids Automated lesion analysis based upon automatic plaque characterization according to a classification criterion Reinforced closure anchor Semiconductor memory device Transparent material processing with an ultrashort pulse laser   Randomly Featured Patents Method of making CMOS devices Color image characterization, enhancement and balancing process Abrasion resistant fibrous nonwoven composite structure Exposure method using reticle remount for temperature influence correction Surgical blade dispenser and disposal apparatus Passive environmental RFID transceiver Low internal temperature technique for hermetic sealing of microelectronic enclosures Word line testability improvement Disc repair system Semiconductor device test probe © 2006. PatentGenius. All Rights Reserved.