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Electrical test instrument |
| D467190 |
Electrical test instrument
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| Patent Drawings: | |
| Inventor: |
Ikeda, et al. |
| Date Issued: |
December 17, 2002 |
| Application: |
D/141,875 |
| Filed: |
May 14, 2001 |
| Inventors: |
Ikeda; John K. (Seattle, WA)
Kearsley; Duncan N. (Stanwood, WA)
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| Assignee: |
Fluke Corporation (Everett, WA) |
| Primary Examiner: |
Davis; Antoine Duval |
| Assistant Examiner: |
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| Attorney Or Agent: |
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| U.S. Class: |
D10/79 |
| Field Of Search: |
D10/79; 324/99D; 324/115; 324/116; 324/117; 324/126; 324/127; 324/128; 324/129; 324/130; 324/142; 324/143; 324/149; 324/156; 324/158F; 324/158P |
| International Class: |
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| U.S Patent Documents: |
D399150; D401172; D440892; D450002; D452659 |
| Foreign Patent Documents: |
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| Other References: |
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| Abstract: |
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| Claim: |
The ornamental design for an electrical test instrument, as shown and described. |
| Description: |
FIG. 1 is a perspective view of a first embodiment of an electrical test instrument showing our new design;
FIG. 2 is a front elevation view thereof;
FIG. 3 is a right side elevation view thereof;
FIG. 4 is a rear elevation view thereof;
FIG. 5 is a left side elevation view thereof;
FIG. 6 is a top plan view thereof; and,
FIG. 7 is a bottom plan view thereof.
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