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Electrical probe |
| D409930 |
Electrical probe
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| Patent Drawings: | |
| Inventor: |
Suurmeijer |
| Date Issued: |
May 18, 1999 |
| Application: |
D/097,192 |
| Filed: |
December 1, 1998 |
| Inventors: |
Suurmeijer; Christian Peter (Amersfoort, NL)
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| Assignee: |
Fluke Corporation (Everett, WA) |
| Primary Examiner: |
Davis; Antoine Duval |
| Assistant Examiner: |
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| Attorney Or Agent: |
Noe; George T. |
| U.S. Class: |
D10/78 |
| Field Of Search: |
D10/78; 324/72.5; 324/156; 324/508; 324/509; 324/538; 340/815.74 |
| International Class: |
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| U.S Patent Documents: |
D349658 |
| Foreign Patent Documents: |
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| Other References: |
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| Abstract: |
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| Claim: |
The ornamental design for an electrical probe, as shown and described. |
| Description: |
FIG. 1 is a perspective view of a an embodiment of an electrical probe showing my new design;
FIG. 2 is a left side elevation view thereof;
FIG. 3 is a top plan view thereof;
FIG. 4 is a right side elevation view thereof;
FIG. 5 is a bottom plan view thereof;
FIG. 6 is a front elevation view thereof; and,
FIG. 7 is a rear elevation view thereof.
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