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Process control instrument |
| D381590 |
Process control instrument
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| Patent Drawings: | |
| Inventor: |
Thoeni, et al. |
| Date Issued: |
July 29, 1997 |
| Application: |
D/054,193 |
| Filed: |
May 8, 1996 |
| Inventors: |
Aland; Trevor (Reno, NV)
Thoeni; Stewart (Carson City, NV)
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| Assignee: |
Elsag International N.V. (Amsterdam, NL) |
| Primary Examiner: |
Davis; Antoine Duval |
| Assistant Examiner: |
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| Attorney Or Agent: |
Rickin; Michael M. |
| U.S. Class: |
D10/49; D10/75; D13/164 |
| Field Of Search: |
D10/49; D10/50; D10/75; D13/164; 57/264; 355/208; 355/246; 364/131; 364/133; 364/138; 364/146; 364/150; 364/162; 364/164; 364/165; 364/187; 364/188; 364/189; 364/468; 364/470; 364/481; 364/482; 364/483; 364/484; 364/485; 364/486; 364/487; 364/550; 364/551; 364/552; 364/553; 364/554; 364/555; 364/556; 364/557; 364/558; 364/559; 364/560; 364/561; 364/562; 364/563; 364/564; 364/565; 364/566; 364/567; 364/568; 364/569; 364/570; 364/571; 364/572; 364/573; 364/574; 364/575; 364/576; 364/577; 364/578; 364/579; 364/580; 364/581; 364/582; 395/200.02 |
| International Class: |
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| U.S Patent Documents: |
D208492; D264449; D264825; D269265; D307708; 5392223; 5506767 |
| Foreign Patent Documents: |
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| Other References: |
Rosemount Analytical, Model pH/ORP Microprocessor Analyzer -Instruction Manual, Mar. 1995, pp. Cover to 1-5..
Great Lakes Instruments, Inc., Model P63 pH Analyzer -Manual No. P63, Revision 1-995, pp. Cover, 29, 16 and 17..
George Fischer -Signet -Measurement Transmitter -Instruction Manual..
Yokogawa, Model SC200 2-Wire Conductivity Transmitter -Instruction Manual, Aug. 1991, pp. Cover, 4 and 5.. |
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| Abstract: |
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| Claim: |
The ornamental design for a process control instrument, as shown and described. |
| Description: |
FIG. 1 is a front, top and right side perspective view of a process control instrument showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a right side elevational view thereof;
FIG. 5 is a left side elevational view thereof; and,
FIG. 6 is a bottom plan view thereof;
FIG. 7 is a top plan view thereof; and,
FIG. 8 is a partial view of the bottom thereof showing another pattern for the holes therein, all other portions of this view are identical to those shown in FIG. 6.
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