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Electrical test probe
D346338 Electrical test probe
Patent Drawings:Drawing: D346338-2    Drawing: D346338-3    Drawing: D346338-4    Drawing: D346338-5    Drawing: D346338-6    
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(5 images)

Inventor: Nightingale, et al.
Date Issued: April 26, 1994
Application: D/005,220
Filed: February 26, 1993
Inventors: Myers; Jonathan E. (Aloha, OR)
Nightingale; Mark W. (Washougal, WA)
Assignee: Tektronix, Inc. (Wilsonville, OR)
Primary Examiner: Douglas; Alan P.
Assistant Examiner: Davis; Antoine D.
Attorney Or Agent: Bucher; William K.
U.S. Class: D10/78
Field Of Search: 324/72.5; 324/158P; D10/78
International Class:
U.S Patent Documents: 4978921; 5032787; 5041781
Foreign Patent Documents:
Other References: Tektronix, Passive Voltage Probes, .COPYRGT.1990, p. 411, provided by applicant..

Claim: The ornamental design for an electrical test probe, as shown and described.
Description: FIG. 1 is a left side elevation view of the electrical test probe showing our new design;

FIG. 2 is a right side elevation view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a rear elevation view thereof; and,

FIG. 6 is a front elevation view thereof.

Portions of the cord member have been eliminated for ease of illustration.

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