Resources Contact Us Home
Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Shelving unit
D334309 Shelving unit
Patent Drawings:Drawing: D334309-2    Drawing: D334309-3    Drawing: D334309-4    
« 1 »

(3 images)

Inventor: Stricker
Date Issued: March 30, 1993
Application: 07/507,065
Filed: April 4, 1990
Inventors: Stricker; Margie E. (Barnesville, GA)
Assignee:
Primary Examiner: Douglas; Alan P.
Assistant Examiner: Asch; Jeffrey
Attorney Or Agent: Gernstein; Terry M.
U.S. Class: D6/449; D6/474
Field Of Search: D6/396; D6/397; D6/449; D6/473; D6/474; D6/468; D6/477; D6/478; D6/479; D25/62; D25/64; 108/91; 108/92; 108/108; 108/111; 211/149; 211/198; 211/187; 211/188
International Class:
U.S Patent Documents: D109291; D138159; D238607; D244093; D259007; D259530; D295809; D299797; D300365; 3170418
Foreign Patent Documents:
Other References: Visual Merchandising & Store Design, Feb. 1988, p. 303, bottom left of page..









Abstract:
Claim: The ornamental design for a shelving unit, as shown and described.
Description: FIG. 1 is a perspective view of a shelving unit showing my new design;

FIG. 2 is a side elevational view, the opposite side being a mirror image thereof;

FIG. 3 is an end elevational view, the opposite end being a mirror image thereof; and,

FIG. 4 is a top plan view thereof.

FIGS. 2-4 have been shown on an enlarged scale with respect to FIG. 1.

* * * * *
 
 
  Recently Added Patents
Calibration method for non-ideal transceivers
Adaptive frame scanning scheme for pulsed X-ray imaging
Artifact removal in nuclear images
Perception-based artifact quantification for volume rendering
Clock face
Magnetic detection of small entities
Rear bumper for an automobile
  Randomly Featured Patents
Memory cell device including overlapping capacitors
Computer cabinet
Flip chip technique for chip assembly
Implementing shadow objects with relocated resources to form relationships between new and old locations
Buried layer substrate isolation in integrated circuits
Fiber optic multiplexer and demultiplexer system
Test and observe mode for embedded memory
Optical resolution of substituted 2-(2-pyridinylmethylsulphinyl)-1H-benzimidazoles
TDDB test pattern and method for testing TDDB of MOS capacitor dielectric
Highly conducting organometallic polymers