Resources Contact Us Home
Motorcycle handlebar grip
D274122 Motorcycle handlebar grip
Patent Drawings:Drawing: D274122-2    
« 1 »

(1 images)

Inventor: Stahel, et al.
Date Issued: June 5, 1984
Application: 06/506,281
Filed: June 20, 1983
Inventors: Preisler; James M. (Mound, MN)
Stahel; Alwin J. (St. Paul, MN)
Assignee: Drag Specialties, Inc. (Minnetonka, MN)
Primary Examiner: Bullock; B. J.
Assistant Examiner:
Attorney Or Agent: Kinney, Lange, Braddock, Westman & Fairbairn
U.S. Class: D8/303
Field Of Search: D8/303; 74/551.8; 74/551.9
International Class:
U.S Patent Documents: D130814; D234907; D246758; 580336; 581287; 586830; 587626; 594939; 604216; 3205729; 4352303
Foreign Patent Documents: 837625; 592660
Other References:

Claim: The ornamental design for a motorcycle handlebar grip, substantially as shown.
Description: FIG. 1 is a side elevational view of the handlebar grip showing our new design, all sides being identical;

FIG. 2 is an end elevational view taken from the left of FIG. 1;

FIG. 3 is an end elevational view taken from the right of FIG. 1.

* * * * *
  Recently Added Patents
Changing sound alerts during a messaging session
Controller for soldering iron
Voltage detecting device for LED driver
Optical recording medium, and method for producing optical recording medium
Radio communication device and sequence length adjusting method
Stroboscopic light source for a transmitter of a large scale metrology system
Flow cytometer method and apparatus
  Randomly Featured Patents
Storage devices having a security function and methods of securing data stored in the storage device
Polymerization of olefins employing catalysts prepared from novel titanium compounds
Packages for devices and components
System and method for detecting a hand-drawn object in ink input
Tennis ball including needle punched fabric cover
Turn indicator for ships or aircraft
Exhibit panel
Extended initialization for personal data processing systems
Development system and methods with direct compiler support for detecting invalid use and management of resources and memory at runtime
Method and apparatus for measuring areas of photoelectric cells and photoelectric cell performance parameters