| |
 |
Micrometer |
| D263809 |
Micrometer
|
|
| Patent Drawings: |  
(2 images) |
|
| Inventor: |
Suwa, et al. |
| Date Issued: |
April 13, 1982 |
| Application: |
06/083,626 |
| Filed: |
October 11, 1979 |
| Inventors: |
Nakata; Kiyohiro (Hiromachi, JP)
Suwa; Hiroaki (Hiromachi, JP)
|
| Assignee: |
Mitutoyo Mfg. Co., Ltd. (Tokyo, JP) |
| Primary Examiner: |
Holtje; Nelson C. |
| Assistant Examiner: |
|
| Attorney Or Agent: |
Koda and Androlia |
| U.S. Class: |
D10/73 |
| Field Of Search: |
D10/73; 33/166 |
| International Class: |
|
| U.S Patent Documents: |
D198710; D239704; D253689; D254655; 3608201; 4168575 |
| Foreign Patent Documents: |
|
| Other References: |
Alina Catalog No. IN-200-2 Instrument Div., p. 7-Diac Micrometer at center.. |
|
| Abstract: |
|
| Claim: |
The ornamental design for a micrometer, substantially as shown and described. |
| Description: |
FIG. 1 is a perspective view of a micrometer showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a top plan view thereof;
FIG. 4 is a rear elevational view thereof;
FIG. 5 is a left-side elevational view thereof;
FIG. 6 is a right-side elevational view thereof; and
FIG. 7 is a bottom plan view thereof.
* * * * * |
|
|
|
