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D263809 Micrometer
Patent Drawings:Drawing: D263809-2    Drawing: D263809-3    
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(2 images)

Inventor: Suwa, et al.
Date Issued: April 13, 1982
Application: 06/083,626
Filed: October 11, 1979
Inventors: Nakata; Kiyohiro (Hiromachi, JP)
Suwa; Hiroaki (Hiromachi, JP)
Assignee: Mitutoyo Mfg. Co., Ltd. (Tokyo, JP)
Primary Examiner: Holtje; Nelson C.
Assistant Examiner:
Attorney Or Agent: Koda and Androlia
U.S. Class: D10/73
Field Of Search: D10/73; 33/166
International Class:
U.S Patent Documents: D198710; D239704; D253689; D254655; 3608201; 4168575
Foreign Patent Documents:
Other References: Alina Catalog No. IN-200-2 Instrument Div., p. 7-Diac Micrometer at center..

Claim: The ornamental design for a micrometer, substantially as shown and described.
Description: FIG. 1 is a perspective view of a micrometer showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a left-side elevational view thereof;

FIG. 6 is a right-side elevational view thereof; and

FIG. 7 is a bottom plan view thereof.

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