| Patent Number |
Title Of Patent |
Date Issued |
| D389883 |
Caboose |
January 27, 1998 |
|
| 7420229 |
Failure analysis vehicle for yield enhancement with self test at speed burnin capability for rel |
September 2, 2008 |
| A test vehicle for evaluating a manufacturing process for integrated circuits that uses a more space efficient layout of library driving cells arranged to produce circuits that exercise many interconnections that may be designed at the minimum design parameters of a manufacturing process |
| 7370257 |
Test vehicle data analysis |
May 6, 2008 |
| A system and method for collecting and analyzing integrated circuit test vehicle test data by identifying various blocks of circuitry through at least two different intersecting test paths. In one embodiment, the process test circuits may be arranged in a matrix format and connected so |
| 7308627 |
Self-timed reliability and yield vehicle with gated data and clock |
December 11, 2007 |
| A test vehicle a system and method for evaluating an interconnect module manufacturing process while dynamically testing performance with high-speed operational frequencies is disclosed. The test vehicle incorporates a self-timed or gated speed circuit that can detect subtle resistiv |
| 7284213 |
Defect analysis using a yield vehicle |
October 16, 2007 |
| A system and method for collecting and analyzing optical inspection results obtained during the manufacturing process and comparing those results to actual functional results of a specially designed test vehicle integrated circuit. The test vehicle integrated circuit allows failures |
| 7222548 |
Elevated black panel for accelerated weathering test device |
May 29, 2007 |
| A black panel assembly for use in an accelerated weathering test device having a specimen table includes a platform disposed on the specimen table, the platform including a plurality of standoffs and a mounting surface, wherein the plurality of standoffs elevate the mounting surface |
| 7154734 |
Fully shielded capacitor cell structure |
December 26, 2006 |
| A linear capacitor design providing shielding on all sides of the linear capacitor. In one aspect the capacitor provides a signal side metal layer substantially enclosed by a dielectric material which is, in turn, substantially enclosed by an upper and lower metal shield layer. in an |
| 7129101 |
Failure analysis vehicle for yield enhancement with self test at speed burnin capability for rel |
October 31, 2006 |
| A test vehicle for evaluating a manufacturing process for integrated circuits that uses a more space efficient layout of library driving cells arranged to produce circuits that exercise many interconnections that may be designed at the minimum design parameters of a manufacturing process |
| 7023252 |
Chip level clock tree deskew circuit |
April 4, 2006 |
| A signal deskew circuit is provided, which includes first and second signal branches, each branch extending between a start location and a respective end location. Each signal branch includes a send path and a return path, which have substantially the same propagation delays. An adju |
| 7008021 |
Interior weld and improved sling |
March 7, 2006 |
| An interior weld for furniture having a tubular member is disclosed. The weld has a first tubular member and a second tubular member. The first tubular member is adapted to receive the tubular second member. An edge of the tubular second member contacts an inner surface of the first |
| 6861864 |
Self-timed reliability and yield vehicle array |
March 1, 2005 |
| A test vehicle a system and method for evaluating an interconnect module manufacturing process while dynamically testing performance with high-speed operational frequencies is disclosed. An interconnect module designed at many of the manufacturing process limits offers complete and f |
| 6851098 |
Static timing analysis and performance diagnostic display tool |
February 1, 2005 |
| Static timing analysis results from multiple corner cases are combined to create a differential results table that may be used to identify components that are a high risk for failure. These results may be combined with a schematic analysis tool that finds overlapping logic cones for |
| 6781151 |
Failure analysis vehicle |
August 24, 2004 |
| A test vehicle for evaluating a manufacturing process for integrated circuits comprises a staircase of vias and traces arranged for maximum test coverage. The staircase may be combined with several functional cells to produce circuits that exercise many interconnections that may be d |
| 6379100 |
Apparatus for loading a truck box |
April 30, 2002 |
| An apparatus for loading a truck box is provided for use with snowmobiles and the like. The apparatus includes a pair of mounting elements arranged to mount on the respective tailgate mounts of the truck box in place of the tailgate of the truck so that no modification to the truck bed i |
| 4704080 |
Matrix for the production of pellets |
November 3, 1987 |
| The present invention provides a matrix for the production of pellets from powdered, granular, fibrous or pre-compressed loose material, said matrix having a plurality of pressure canals passing therethrough through which the loose material is forced and having cutting means which divide |
| 4690339 |
Hammer mill |
September 1, 1987 |
| The hammer mill comprises a horizontally arranged grinding chamber (1), at the periphery of which several supply ducts (4) with an inlet (7a) for the coarse material to undergo size reduction are distributed, each supply duct (4) being associated with a corresponding adjacent discharge d |
| 4148596 |
Pelletizing press |
April 10, 1979 |
| An improved pelletizing press for producing pressed feed products and the like, of the type comprising a radially perforated die with at least two pressing rollers oppositely mounted therein and driven by frictional engagement with the rotary die. The improvement provided by the inventio |
| 3930712 |
Dual turret attachment for a microscope and the like |
January 6, 1976 |
| A sub-stage, dual-turret assembly provides a rapid interchange of condensers and birefringent elements without sub-stage assembly, disturbance of illumination system, refocusing the microscope or dislocation of the object being studied and minimizes storage problems normally associat |
