| Patent Number |
Title Of Patent |
Date Issued |
| 7321233 |
System for evaluating probing networks |
January 22, 2008 |
| An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing area |
| 7164279 |
System for evaluating probing networks |
January 16, 2007 |
| An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing area |
| 6987398 |
System for evaluating probing networks |
January 17, 2006 |
| An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing area |
| 6803779 |
Interconnect assembly for use in evaluating probing networks |
October 12, 2004 |
| An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas |
| 6608496 |
Reference transmission line junction for probing device |
August 19, 2003 |
| An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas |
| 6130544 |
System for evaluating probing networks |
October 10, 2000 |
| An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas |
| 5973505 |
System for evaluating probing networks |
October 26, 1999 |
| An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas |
| 5869975 |
System for evaluating probing networks that have multiple probing ends |
February 9, 1999 |
| An interconnect assembly for evaluating a probe measurement network includes a base, respective first, second and third device-probing areas arranged on an upper face of the base in spaced-apart relation so that first, second and third device-probing ends belonging to the measurement |
| 5659255 |
Method of evaluating signal conditions in a probe measurement network having a plurality of sepa |
August 19, 1997 |
| A method of evaluating the signal conditions in a probe measurement network of the type having a plurality of separate measurement channels, where each channel communicates through a corresponding device-probing end. The method includes providing an assembly which includes a conductive p |
| 5561377 |
System for evaluating probing networks |
October 1, 1996 |
| An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas |
