Resources Contact Us Home Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE     S. Gabriel R. Dosdos Patents Inventor: R. Dosdos; S. Gabriel Address: San Jose, CA No. of patents: 1 Patents: Patent Number Title Of Patent Date Issued 6433360 Structure and method of testing failed or returned die to determine failure location and type August 13, 2002 A structure and method for testing a failed integrated circuit device includes a ball grid array substrate with its heat sink removed to form a cavity where a failed bare die is to be placed. An adhesive tape is attached to the lower surface of the ball grid array substrate covering       Recently Added Patents Encrypted data delivery system Minature rose plant named `Poulpal023` Fabrication and use of semipermeable membranes and gels for the control of electrolysis in a microfluidic device Oscillation sensor for linear regulation circuit Frame synchronization circuit Humanized immunoglobulin reactive with .alpha.4.beta.7 integrin Projection television   Randomly Featured Patents Text editor with memory for eliminating duplicate sentences Total synthesis of (.+-.)-picropodophyllone and (.+-.)-4'-demethylpicropodophyllone Connector arrangement Snap-lock connection for two parts which can rotate in relation to each other Light bar Crumb shovel Picket fence rail Positively charged developer compositions containing quaternized vinyl pyridine polymers Mounting bracket for handlebar crossbar Quick-coupling assembly © 2006-2008 PatentGenius. All Rights Reserved.