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Hisashi Ohtani Patents - Page: 7
Inventor:
Ohtani; Hisashi
Address:
Kanagawa, JP
No. of patents:
312
Patents:


1 2 3 4 5 6 7


Patent Number Title Of Patent Date Issued
5789284 Method for fabricating semiconductor thin film August 4, 1998
An object of the present invention is to provide a technology of reducing a nickel element in the silicon film which is crystallized by using nickel. An extremely small amount of nickel is introduced into an amorphous silicon film which is formed on the glass substrate. Then this amorpho
5705829 Semiconductor device formed using a catalyst element capable of promoting crystallization January 6, 1998
A semiconductor device using a crystalline semiconductor film is manufactured. The crystalline semiconductor film is formed by providing an amorphous silicon film with a catalyst metal for promoting a crystallization thereof and then heated for performing a thermal crystallization, f
5656825 Thin film transistor having crystalline semiconductor layer obtained by irradiation August 12, 1997
An amorphous semiconductor film having a thickness of 400.ANG. or more is formed on an insulating surface and is wholly or selectively etched to form a region having a thickness 300.ANG. or less. This is used as a channel-forming region in a TFT.
5654203 Method for manufacturing a thin film transistor using catalyst elements to promote crystallizati August 5, 1997
In a method for crystallizing an amorphous silicon film by a heat treatment that is effected for a duration of about 4 hours at about 550.degree. C. using a catalyst element for accelerating the crystallization, the quantity of the catalyst element to be introduced into the amorphous
5643826 Method for manufacturing a semiconductor device July 1, 1997
A process for fabricating a highly stable and reliable semiconductor, comprising: coating the surface of an amorphous silicon film with a solution containing a catalyst element capable of accelerating the crystallization of the amorphous silicon film, and heat treating the amorphous
5612250 Method for manufacturing a semiconductor device using a catalyst March 18, 1997
A method for manufacturing a thin film transistor having a crystalline silicon layer as an active layer comprises the steps of disposing a solution containing a catalyst for promoting a crystallization of silicon in contact with an amorphous silicon film, crystallizing the amorphous
5585291 Method for manufacturing a semiconductor device containing a crystallization promoting material December 17, 1996
A method for manufacturing a semiconductor device having a crystalline silicon semiconductor layer comprises the steps of heat crystallizing an amorphous silicon semiconductor layer at a relatively low temperature because of the use of a crystallization promoting material such as Ni, Pd,
5543352 Method for manufacturing a semiconductor device using a catalyst August 6, 1996
A method for manufacturing a thin film transistor having a crystalline silicon layer as an active layer comprises the steps of disposing a solution containing a catalyst for promoting a crystallization of silicon in contact with an amorphous silicon film, crystallizing the amorphous
5436516 Inertial device for energy storage July 25, 1995
An energy storage device which comprises at least a first object having a rotational mechanism which rotates around an axis and a surface which generates a magnetic field; at least a second object comprising a superconductor and having provided separately from said first object but f
5326746 Fabrication method of superconductive thin film transistor July 5, 1994
A planar type superconductive thin film transistor using oxide superconductive materials and utilizing a long distance proximity effect is obtained with a good reproducibility.In order to obtain the planar type superconductive transistor utilizing the long distance proximity effect, an i
5322818 Method for forming an oxide superconducting material June 21, 1994
A method for forming an oxide superconducting material by preparing first a shaped magnetic shield comprising an oxide superconductor as a matrix, and then effecting CVD and further EVD to fill in the pores of the matrix with an oxide superconductor; more specifically, it comprises intro
5225396 Method for forming an oxide superconducting film July 6, 1993
A method for forming an oxide superconducting film is disclosed. A substrate member comprising an oxygen ion conductor and a material provided thereon having oxygen permeability and good fitting of lattice constant to the oxide superconducting film is prepared, and then an oxide supe
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