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Richard W. O'Connell Patents |
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Inventor: O'Connell; Richard W.
Address: Austin, TX
No. of patents: 1
Patents:
| Patent Number |
Title Of Patent |
Date Issued |
| 6166552 |
Method and apparatus for testing a semiconductor wafer |
December 26, 2000 |
| A probing apparatus includes a prober (210) and a test head (130) that includes a test head mother board (132). A load board 218 and a probe card (216) are connect to each other and the test head mother board (132) using conductive bumps (219). The need for a table top for the prober (21 |
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