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Mark M. Nelson Patents
Inventor:
Nelson; Mark M.
Address:
Pocatello, ID
No. of patents:
2
Patents:




Patent Number Title Of Patent Date Issued
7141503 Methods for manufacturing a soft error and defect resistant pre-metal dielectric layer November 28, 2006
A method for forming a pre-metallization layer on an underlying micro-structure, and a corresponding micro-structure formed by the method. The micro-structure may be a semiconductor circuit and/or a Micro-Electro-Mechanical Systems (MEMS) device. A first layer of undoped silicate gla
6960529 Methods for sidewall protection of metal interconnect for unlanded vias using physical vapor dep November 1, 2005
Methods for protecting the sidewall of a metal interconnect component using Physical Vapor Deposition (PVD) processes and using a single barrier metal material. After forming the metal interconnect component, a single barrier metal is deposited on its sidewall using PVD. A subsequent ani


 
 
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