An integrated circuit containing analogue operation circuitry having a plurality of nodes for input and output of signals during normal operation, a plurality of scan cells connected to at least said plurality of nodes for containing signals to be utilized in selected tests to be per
An integrated circuit containing analogue operation circuitry having a plurality of nodes for input and output of signals during normal operation, a plurality of scan cells connected to at least said plurality of nodes for containing signals to be utilized in selected tests to be per
An apparatus and method for maintaining variable data in a non-volatile electronic memory device comprises a shifter array (106) which provides a shifter value to shifter register (104). Shifter register (104) uses 8-bit column decoder (110) to specify which of a plurality of overlapping
A memory test method and system are described which comprises a first memory array and a second memory array coupled to a plurality of row address lines within a memory system. During the testing of the memory system, row decode logic is used to sequentially access each of the row ad
