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Yuichiro Morozumi Patents
Inventor:
Morozumi; Yuichiro
Address:
Tokyo, JP
No. of patents:
3
Patents:




Patent Number Title Of Patent Date Issued
7368384 Film formation apparatus and method of using the same May 6, 2008
A method of using a film formation apparatus for a semiconductor process includes a step of removing a by-product film deposited on an inner surface of a reaction chamber of the film formation apparatus. This step is performed while supplying a cleaning gas containing hydrogen fluoride
7041546 Film forming method for depositing a plurality of high-k dielectric films May 9, 2006
In a capacitor of an MIM (Metal-Insulator-Metal) structure, a silicon-containing high dielectric film (e.g., a hafnium silicate film) containing a silicon atom, as well as a silicon-free high dielectric film (e.g., a tantalum oxide film) containing no silicon atom is interposed betwe
6313047 MOCVD method of tantalum oxide film November 6, 2001
Disclosed is an MOCVD method of forming a tantalum oxide film. First, water vapor used as an oxidizing agent is supplied into a process container to cause moisture to be adsorbed on a surface of each semiconductor wafer. Then, PET gas used as a raw material gas is supplied into the proce


 
 
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