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Shuang Meng Patents
Inventor:
Meng; Shuang
Address:
Boise, ID
No. of patents:
15
Patents:




Patent Number Title Of Patent Date Issued
7431966 Atomic layer deposition method of depositing an oxide on a substrate October 7, 2008
The invention includes atomic layer deposition methods of depositing an oxide on a substrate. In one implementation, a substrate is positioned within a deposition chamber. A first species is chemisorbed onto the substrate to form a first species monolayer within the deposition chamber
7410898 Methods of fabricating interconnects for semiconductor components August 12, 2008
In one aspect, the invention encompasses a method of fabricating an interconnect for a semiconductor component. A semiconductor substrate is provided, and an opening is formed which extends entirely through the substrate. A first material is deposited along sidewalls of the opening a
7390746 Multiple deposition for integration of spacers in pitch multiplication process June 24, 2008
Pitch multiplication is performed using a two step process to deposit spacer material on mandrels. The precursors of the first step react minimally with the mandrels, forming a barrier layer against chemical reactions for the deposition process of the second step, which uses precurso
7329615 Atomic layer deposition method of forming an oxide comprising layer on a substrate February 12, 2008
This invention includes atomic layer deposition methods of depositing oxide comprising layers on substrates. In one implementation, a substrate is positioned within a deposition chamber. A first species is chemisorbed to form a first species monolayer onto the substrate within the de
7282239 Systems and methods for depositing material onto microfeature workpieces in reaction chambers October 16, 2007
In one embodiment, the system includes a gas supply assembly having a first gas source, a first gas conduit coupled to the first gas source, a first valve assembly, a reaction chamber, and a gas distributor carried by the reaction chamber. The first valve assembly includes first and
7279732 Enhanced atomic layer deposition October 9, 2007
A method of enhanced atomic layer deposition is described. In an embodiment, the enhancement is the use of plasma. Plasma begins prior to flowing a second precursor into the chamber. The second precursor reacts with a prior precursor to deposit a layer on the substrate. In an embodim
7253118 Pitch reduced patterns relative to photolithography features August 7, 2007
Differently-sized features of an integrated circuit are formed by etching a substrate using a mask which is formed by combining two separately formed patterns. Pitch multiplication is used to form the relatively small features of the first pattern and conventional photolithography us
7189642 Methods of fabricating interconnects including depositing a first material in the interconnect w March 13, 2007
In one aspect, the invention encompasses a method of fabricating an interconnect for a semiconductor component. A semiconductor substrate is provided, and an opening is formed which extends entirely through the substrate. A first material is deposited along sidewalls of the opening a
7172947 High dielectric constant transition metal oxide materials February 6, 2007
A transition metal oxide dielectric material is doped with a non-metal in order to enhance the electrical properties of the metal oxide. In a preferred embodiment, a transition metal oxide is deposited over a bottom electrode and implanted with a dopant. In a preferred embodiment, the
7119034 Atomic layer deposition method of forming an oxide comprising layer on a substrate October 10, 2006
This invention includes atomic layer deposition methods of depositing oxide comprising layers on substrates. In one implementation, a substrate is positioned within a deposition chamber. A first species is chemisorbed to form a first species monolayer onto the substrate within the de
7071098 Methods of fabricating interconnects for semiconductor components including a through hole entir July 4, 2006
In one aspect, the invention encompasses a method of fabricating an interconnect for a semiconductor component. A semiconductor substrate is provided, and an opening is formed which extends entirely through the substrate. A first material is deposited along sidewalls of the opening a
7067438 Atomic layer deposition method of forming an oxide comprising layer on a substrate June 27, 2006
This invention includes atomic layer deposition methods of depositing oxide comprising layers on substrates. In one implementation, a substrate is positioned within a deposition chamber. A first species is chemisorbed to form a first species monolayer onto the substrate within the de
6967154 Enhanced atomic layer deposition November 22, 2005
A method of enhanced atomic layer deposition is described. In an embodiment, the enhancement is the use of plasma. Plasma begins prior to flowing a second precursor into the chamber. The second precursor reacts with a prior precursor to deposit a layer on the substrate. In an embodim
6943106 Methods of fabricating interconnects for semiconductor components including plating solder-wetti September 13, 2005
In one aspect, the invention encompasses a method of fabricating an interconnect for a semiconductor component. A semiconductor substrate is provided, and an opening is formed which extends entirely through the substrate. A first material is deposited along sidewalls of the opening at
6844260 Insitu post atomic layer deposition destruction of active species January 18, 2005
Systems and methods for insitu post atomic layer deposition (ALD) destruction of active species are provided. ALD processes deposit multiple atomic layers on a substrate. Pre-cursor gases typically enter a reactor and react with the substrate resulting in a monolayer of atoms. After the


 
 
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