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Takeshi Kiso Patents
Inventor:
Kiso; Takeshi
Address:
Odawara, JP
No. of patents:
2
Patents:




Patent Number Title Of Patent Date Issued
6208371 Laser beam image recording apparatus March 27, 2001
A laser beam emitted by a semiconductor laser is applied through a beam shaper optical system to a recording film to produce the image of a near field pattern of the laser beam which is of a narrow width in a main scanning direction of the recording film and which has a wide, substan
4982600 Method of measuring the period of surface defects January 8, 1991
To measure the period with which a surface defect recurs in a surface of a web-like material moving in its lengthwise direction, surface defects distributed over the surface are detected in that lengthwise direction. Positional data and distance data as to the detected surface defects


 
 
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