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Reid Hayhow Patents
Inventor:
Hayhow; Reid
Address:
La Porte, CO
No. of patents:
8
Patents:




Patent Number Title Of Patent Date Issued
7421360 Method and apparatus for handling a user-defined event that is generated during test of a device September 2, 2008
In one embodiment, and in response to an ordered sequence of events corresponding to execution of a plurality of tests on at least one device under test (DUT), 1) a plurality of data objects are created, the data objects including A) some data objects that correspond to logical group
7415479 Method and apparatus for assigning test numbers August 19, 2008
In a method for assigning test numbers, current testflow context information is maintained during execution of a testflow. Upon execution of a subtest in the testflow, a database of test numbers is indexed using index information comprising 1) an identifier of the subtest, and 2) the
7373360 Methods and apparatus that use contextual test number factors to assign test numbers May 13, 2008
In a method for assigning test numbers, current testflow context information is maintained during the execution of a testflow. If one or more test number factors have been specified for one or more levels of the current testflow context, the test number factors are used to determine
7321967 System and method for configuring capabilities of printed circuit boards January 22, 2008
Methods for configuring the capabilities of electronic systems containing printed circuit boards are provided. One such method comprises: providing an initial configuration describing a first set of capabilities corresponding to each PCB as currently configured; modifying the initial
7181358 Method, apparatus and database using a map of linked data nodes for storing test numbers February 20, 2007
In a method for assigning test numbers, current testflow context information is maintained during execution of a testflow. The information is maintained as an array of one or more context values. Upon execution of a subtest in the testflow, a map of linked data nodes is indexed using
7076388 Methods and apparatus for handling test number collisions July 11, 2006
Apparatus for handling test number collisions comprises program code stored on computer readable media. The code, in response to a collision between first and second test numbers, automatically adjusts the second test number in response to a collision tracking value associated with the
7031867 Methods and apparatus for identifying test number collisions April 18, 2006
In a method for assigning test numbers, current testflow context information is maintained during the execution of a testflow. Upon generation of a new test number for a result of a subtest in the testflow, a database of test numbers is indexed using the new test number. If the new t
7024322 Dynamic waveform resource management April 4, 2006
A dynamic waveform manager and an application policy are provided to an electronic device that executes an application requiring the use of waveforms accessed from a waveform table characterized by a limited number of entries. The application policy contains waveform sequencing infor


 
 
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