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Hidenari Hachino Patents
Inventor:
Hachino; Hidenari
Address:
Nagasaki, JP
No. of patents:
7
Patents:




Patent Number Title Of Patent Date Issued
7423902 Storage device and semiconductor apparatus September 9, 2008
A storage device includes memory cells disposed in a matrix. The memory cells each include a storage element whose resistance changes from a higher state to a lower state when an electric signal of a first threshold level or higher is applied and whose resistance changes from the low
7372718 Storage and semiconductor device May 13, 2008
A storage device includes a storage element having characteristics such that the resistance value thereof changes from a high state to a low state as a result of an electrical signal higher than or equal to a first threshold signal being applied and changes from a low state to a high
7345908 Memory device March 18, 2008
The present invention is to provide a memory device including: a plurality of memory cells that each include a memory element having a memory layer and first and second electrodes that sandwich the memory layer, the plurality of memory cells being divided into memory blocks of m columns
7336520 Storage device and semiconductor apparatus February 26, 2008
A storage device includes a storage element having first and second terminals that cause a first electrical characteristic change when an electric signal of a first threshold level or higher is applied and that cause a second electrical characteristic change, which is asymmetrical to
7242606 Storage apparatus and semiconductor apparatus July 10, 2007
A storage apparatus includes memory devices each having a storage element with a characteristic that the application of an electric signal not lower than a first threshold signal allows the storage element to shift from a high resistance value state to a low resistance value state, and
7239542 Storage apparatus July 3, 2007
The present invention provides a storage apparatus including a variable resistance element having a recording layer between two electrodes. In the variable resistance element, a resistance value of the recording layer is reversibly changed to one of a value in a high-resistance state
7209379 Storage device and semiconductor device April 24, 2007
A storage device is proposed, which includes: a source line arranged along a row direction; a bit line arranged along a column direction; a storage element arranged at an intersection of the source line and the bit line; a writing circuit connected to one terminal of the bit line and app


 
 
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