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Fernando Gonzalez Patents
Inventor:
Gonzalez; Fernando
Address:
Boise, ID
No. of patents:
286
Patents:


1 2 3 4 5 6


Patent Number Title Of Patent Date Issued
7358171 Method to chemically remove metal impurities from polycide gate sidewalls April 15, 2008
An embodiment includes a process of forming a gate stack that acts to resist the redeposition to the semiconductive substrate of mobilized metal such as from a metal gate electrode. An embodiment also relates to a system that achieves the process. An embodiment also relates to a gate
7355244 Electrical devices with multi-walled recesses April 8, 2008
The invention relates to a vertical transistor and an oxidation process that achieves a substantially curvilinear recess bottom. The recess serves as the gate receptacle that may facilitate a more uniform gate oxide layer. One embodiment relates to a storage cell that is disposed in
7332790 Semiconductor device having an active area partially isolated by a lateral cavity February 19, 2008
A process of making a partial silicon-on-insulator ledge is disclosed. A deep implantation region is created in a substrate. During a lateral cavity etch, the deep implantation region resists etching. The lateral cavity etch acts to partially isolate an active area above the deep imp
7326960 Semiconductor circuit constructions February 5, 2008
The invention includes a method of forming semiconductor circuitry wherein a first semiconductor structure comprising a first monocrystalline semiconductor substrate is bonded to a second semiconductor structure comprising a second monocrystalline semiconductor substrate. The first s
7279725 Vertical diode structures October 9, 2007
A method of making a vertical diode structure is provided, the vertical diode structure having associated therewith a diode opening extending through an insulation layer and contacting an active region on a silicon wafer. A titanium silicide layer covers the interior surface of the diode
7276756 Memory cell arrays October 2, 2007
The invention includes a method of forming an array of memory cells. A series of capacitor constructions is formed, with the individual capacitor constructions having storage nodes. The capacitor constructions are defined to include a first set of capacitor constructions and a second
7273469 Modified needle catheter for directional orientation delivery September 25, 2007
Methods and apparatus for delivering a treatment agent through a percutaneous delivery apparatus are herein disclosed. In some embodiments, an apparatus can include an expandable body with at least one delivery cannula having a lumen therethrough coupled to an exterior portion of the
7250680 Semiconductor circuitry constructions July 31, 2007
The invention includes a method of forming semiconductor circuitry wherein a first semiconductor structure comprising a first monocrystalline semiconductor substrate is bonded to a second semiconductor structure comprising a second monocrystalline semiconductor substrate. The first s
7230312 Transistor having vertical junction edge and method of manufacturing the same June 12, 2007
Techniques for forming devices, such as transistors, having vertical junction edges. More specifically, shallow trenches are formed in a substrate and filled with an oxide. Cavities may be formed in the oxide and filled with a conductive material, such a heavily doped polysilicon. Ve
7202519 Memory cells having an access transistor with a source/drain region coupled to a capacitor throu April 10, 2007
Fabrication of memory cell capacitors in an over/under configuration facilitates increased capacitance values for a given die area. A pair of memory cells sharing a bit-line contact include a first capacitor below the substrate surface. The pair of memory cells further include a second
7199017 Methods of forming semiconductor circuitry April 3, 2007
The invention includes a method of forming semiconductor circuitry. A monocrystalline silicon substrate is provided, and a mask is formed which covers a first portion of the substrate and leaves a second portion uncovered. A trench is formed in the uncovered portion and at least part
7189662 Methods of forming semiconductor constructions March 13, 2007
The invention includes methods of forming and/or passivating semiconductor constructions. In particular aspects, various oxides of a semiconductor substrate can be formed by exposing semiconductive material of the substrate to deuterium-enriched steam. In other aspects, a semiconductor
7179703 Method of forming shallow doped junctions having a variable profile gradation of dopants February 20, 2007
Disclosed are methods for forming a shallow junction with a variable concentration profile gradation of dopants. The process of the present invention includes first providing and masking a surface on an in-process integrated circuit wafer on which the shallow junction is to be formed.
7170103 Wafer with vertical diode structures January 30, 2007
A method of making a vertical diode is provided, the vertical diode having associated therewith a diode opening extending through an insulation layer and contacting an active region on a silicon wafer. A titanium silicide layer covers the interior surface of the diode opening and con
7166875 Vertical diode structures January 23, 2007
A method of making a vertical diode is provided, the vertical dioxide having associated therewith a diode opening extending through an insulation layer and contacting an active region on a silicon wafer. A titanium silicide layer covers the interior surface of the diode opening and c
7160785 Container capacitor structure and method of formation thereof January 9, 2007
Disclosed is a container capacitor structure and method of constructing it. An etch mask and etch are used to expose portions of an exterior surface of electrode ("bottom electrodes") of the container capacitor structure. The etch provides a recess between proximal pairs of container
7151041 Methods of forming semiconductor circuitry December 19, 2006
The invention includes a method of forming semiconductor circuitry wherein a first semiconductor structure comprising a first monocrystalline semiconductor substrate is bonded to a second semiconductor structure comprising a second monocrystalline semiconductor substrate. The first s
7115957 Semiconductor raised source-drain structure October 3, 2006
A transistor structure which includes a raised source, a raised drain, a gate located between the source and the drain, a first capping layer in communication with at least a portion of the gate and the source, a second capping layer in communication with at least a portion of the gate
7115451 Methods of forming semiconductor circuitry October 3, 2006
The invention includes a method of forming semiconductor circuitry wherein a first semiconductor structure comprising a first monocrystalline semiconductor substrate is bonded to a second semiconductor structure comprising a second monocrystalline semiconductor substrate. The first s
7098122 Method of fabricating a vertically integrated memory cell August 29, 2006
A unique cell structure for use in flash memory cell and a method of fabricating the memory cell. More particularly, a vertically integrated transistor having a pair of floating gates is fabricated within a trench in a substrate. The floating gates are fabricated using sidewall spacers
7087468 Method for forming conductors in semiconductor devices August 8, 2006
A memory device wherein a diode is serially connected to a programmable resistor and is in electrical communication with a buried digit line. An electrically conductive plug is electrically interposed between the digit line and a strapping layer, thereby creating a double metal scheme
7060599 Method of forming shallow doped junctions having a variable profile gradation of dopants June 13, 2006
Disclosed is an electrical device having, and a process for forming, a shallow junction with a variable concentration profile gradation of dopants. The process of the present invention includes first providing and masking a surface on an in-process integrated circuit wafer on which t
7045439 Methods of forming semiconductor constructions May 16, 2006
The invention includes a method of forming a semiconductor construction. A first substrate is provided which comprises silicon-containing structures separated from one another by an insulative material. The silicon-containing structures define an upper surface. A second semiconductor
7041556 Vertical transistor and method of making May 9, 2006
The invention relates to a vertical transistor and an oxidation process that achieves a substantially curvilinear recess bottom. The recess serves as the gate receptacle that may facilitate a more uniform gate oxide layer. One embodiment relates to a storage cell that is disposed in
7005710 Transistors having controlled conductive spacers, uses of such transistors and methods of making February 28, 2006
A transistor structure includes an insulated conductive gate spacer or a conductive layer under a nonconductive spacer, together forming a composite spacer, which is contacted and driven separately from the conventional gate of the transistor. The gate spacer, conductive layer of a c
7005692 Memory cell arrays February 28, 2006
The invention includes a method of forming an array of memory cells. A series of capacitor constructions is formed, with the individual capacitor constructions having storage nodes. The capacitor constructions are defined to include a first set of capacitor constructions and a second
6979631 Methods of forming semiconductor circuitry December 27, 2005
The invention includes a method of forming semiconductor circuitry. A monocrystalline silicon substrate is provided, and a mask is formed which covers a first portion of the substrate and leaves a second portion uncovered. A trench is formed in the uncovered portion and at least part
6967132 Methods of forming semiconductor circuitry November 22, 2005
The invention includes a method of forming semiconductor circuitry. A monocrystalline silicon substrate is provided, and a mask is formed which covers a first portion of the substrate and leaves a second portion uncovered. A trench is formed in the uncovered portion and at least part
6964896 Methods of forming semiconductor logic circuitry, and semiconductor logic circuit constructions November 15, 2005
The invention includes a method of forming semiconductor circuitry wherein a first semiconductor structure comprising a first monocrystalline semiconductor substrate is bonded to a second semiconductor structure comprising a second monocrystalline semiconductor substrate. The first s
6962020 Fishing leader holder and method November 8, 2005
A fishing leader holder which allows fishermen and fisherwomen to carry leaders of various lengths without the threat of the leaders becoming bent or being caught on other objects. The fishing leader holder (1) is comprised of a holder (1) and two ends (2) and (3) that receive fishing
6958519 Methods of forming field effect transistors and field effect transistor circuitry October 25, 2005
Methods of forming field effect transistors and resultant field effect transistor circuitry are described. In one embodiment, a semiconductive substrate includes a field effect transistor having a body. A first resistive element is received by the substrate and connected between the
6958268 Methods of forming memory cell arrays October 25, 2005
The invention includes a method of forming an array of memory cells. A series of capacitor constructions is formed, with the individual capacitor constructions having storage nodes. The capacitor constructions are defined to include a first set of capacitor constructions and a second set
6946713 Multiple thickness gate dielectric layers September 20, 2005
Dual gate dielectric constructions and methods therefor are disclosed for different regions on an integrated circuit. In the illustrated embodiment, gate dielectrics in memory array regions of the chip are formed of silicon oxide, while the gate dielectric in the peripheral region compri
6946173 Catheter balloon formed of ePTFE and a diene polymer September 20, 2005
A catheter balloon formed of a polymeric material such as expanded polytetrafluoroethylene (ePTFE) bonded to a second layer formed of a low tensile set polymer and/or impregnated with a low tensile set polymer. In a presently preferred embodiment, the low tensile set polymer is a sil
6927431 Semiconductor circuit constructions August 9, 2005
The invention includes a method of forming semiconductor circuitry wherein a first semiconductor structure comprising a first monocrystalline semiconductor substrate is bonded to a second semiconductor structure comprising a second monocrystalline semiconductor substrate. The first s
6917083 Local ground and VCC connection in an SRAM cell July 12, 2005
A retrograde well region, having a buried layer of high conductivity, is formed in a semiconductor substrate. A trench structure is selectively etched in the semiconductor substrate down to a region proximate to or within the buried layer. A conducting local interconnect material is
6908868 Gas passivation on nitride encapsulated devices June 21, 2005
A method for passivating at least interfaces between structures formed from a conductive or semiconductive material and adjacent dielectric structures so as to reduce a concentration of dangling silicon bonds at these interfaces and to reduce or eliminate the occurrence of unwanted volta
6894310 Semiconductor constructions comprising monocrystalline silicon together with semiconductive mate May 17, 2005
The invention includes a method of forming semiconductor circuitry. A monocrystalline silicon substrate is provided, and a mask is formed which covers a first portion of the substrate and leaves a second portion uncovered. A trench is formed in the uncovered portion and at least part
6887753 Methods of forming semiconductor circuitry, and semiconductor circuit constructions May 3, 2005
The invention includes a method of forming semiconductor circuitry wherein a first semiconductor structure comprising a first monocrystalline semiconductor substrate is bonded to a second semiconductor structure comprising a second monocrystalline semiconductor substrate. The first s
6882031 Ammonia gas passivation on nitride encapsulated devices April 19, 2005
A passivation method includes disassociating ammonia so as to expose at least interfaces between silicon-containing and passivation structures to at least hydrogen species derived from the ammonia and forming an encapsulant layer that is positioned so as to substantially contain the
6863757 Method of making an expandable medical device formed of a compacted porous polymeric material March 8, 2005
A method of making a catheter balloon or other expandable tubular medical device or component thereof formed of a compacted porous polymeric material, in which a tube of porous polymeric material is axially compacted, preferably without increasing the outer diameter of the tube, by p
6861326 Methods of forming semiconductor circuitry March 1, 2005
The invention includes a method of forming semiconductor circuitry. A monocrystalline silicon substrate is provided, and a mask is formed which covers a first portion of the substrate and leaves a second portion uncovered. A trench is formed in the uncovered portion and at least part
6855124 Flexible polymer needle catheter February 15, 2005
A catheter device having an elongated tubular member with a proximal end and a distal end, and a needle disposed near the distal end. In one embodiment, the needle has a rigid, penetrating tip coupled to a flexible portion by an overlapping joint. The flexible portion enables the needle
6844243 Methods of forming semiconductor constructions January 18, 2005
The invention includes a method of forming a semiconductor construction. A first substrate is provided which comprises silicon-containing structures separated from one another by an insulative material. The silicon-containing structures define an upper surface. A second semiconductor
6828614 Semiconductor constructions, and methods of forming semiconductor constructions December 7, 2004
The invention includes an array of devices and a charge pump supported by a semiconductive material substrate. A damage region is under the array, and extends less than or equal to 50% of a distance between the array and the charge pump. The invention also includes a method in which a ma
6800899 Vertical transistors, electrical devices containing a vertical transistor, and computer systems October 5, 2004
The invention relates to a vertical transistor and an oxidation process that achieves a substantially curvilinear recess bottom. The recess serves as the gate receptacle that may facilitate a more uniform gate oxide layer. One embodiment relates to a storage cell that is disposed in the
6798013 Vertically integrated flash memory cell and method of fabricating a vertically integrated flash September 28, 2004
A unique cell structure for use in flash memory cell and a method of fabricating the memory cell. More particularly, a vertically integrated transistor having a pair of floating gates is fabricated within a trench in a substrate. The floating gates are fabricated using sidewall spacers
6794239 Method of fabrication of semiconductor structures by ion implantation September 21, 2004
The present invention relates to the formation of trench isolation structures that isolate active areas and a preferred doping in the fabrication of a CMOS device with a minimized number of masks. Ions of a P-type dopant are implanted into a semiconductor substrate having therein a P
6787401 Method of making vertical diode structures September 7, 2004
A method of making a vertical diode is provided, the vertical dioxide having associated therewith a diode opening extending through an insulation layer and contacting an active region on a silicon wafer. A titanium silicide layer covers the interior surface of the diode opening and c
6784076 Process for making a silicon-on-insulator ledge by implanting ions from silicon source August 31, 2004
A process of making a partial silicon-on-insulator ledge is disclosed. A deep implantation region is created in a substrate. During a lateral cavity etch, the deep implantation region resists etching. The lateral cavity etch acts to partially isolate an active area above the deep imp
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