| Patent Number |
Title Of Patent |
Date Issued |
| 6172924 |
Memory device with a sense amplifier |
January 9, 2001 |
| A circuit for a sense amplifier (14) for use with a memory device (10). The circuit includes two devices (40 and 42) that are controlled by a selector (44). The first device (40) drives the sense amplifier (14) with a first current level. The second device (42) drives the sense amplifier |
| 6058058 |
Memory device with a sense amplifier |
May 2, 2000 |
| A circuit for a sense amplifier (14) for use with a memory device (10). The circuit includes two devices (40 and 42) that are controlled by a selector (44). The first device (40) drives the sense amplifier (14) with a first current level. The second device (42) drives the sense amplifier |
| 5940338 |
Memory device with a sense amplifier |
August 17, 1999 |
| A circuit for a sense amplifier (14) for use with a memory device (10). The circuit includes two devices (40 and 42) that are controlled by a selector (44). The first device (40) drives the sense amplifier (14) with a first current level. The second device (42) drives the sense amplifier |
| 5920516 |
Circuit and method for enabling a function in a multiple memory device module |
July 6, 1999 |
| A memory device module in a package having externally accessible contacts includes multiple integrated memory circuits accessible to external circuitry exclusively through the contacts. An accessing circuit for each memory circuit accesses memory cells in the memory circuit for commu |
| 5901099 |
Memory device with a sense amplifier |
May 4, 1999 |
| A circuit for a sense amplifier (14) for use with a memory device (10). The circuts includes two devices(40 and 42) that are controlled by a selector (44). The first device (40) drives the sense amplifier (14) with a first current level. The second device (42) drives the sense amplifier( |
| 5825697 |
Circuit and method for enabling a function in a multiple memory device module |
October 20, 1998 |
| A memory device module in a package having externally accessible contacts includes multiple integrated memory circuits accessible to external circuitry exclusively through the contacts. An accessing circuit for each memory circuit accesses memory cells in the memory circuit for commu |
| 5790463 |
On-chip mobile ion contamination test circuit |
August 4, 1998 |
| A circuit for testing for mobile ion contamination of a semiconductor chip has an enabling circuit, a voltage pump, and a regulating circuit. In a normal operating mode, the voltage pump is enabled whenever the substrate voltage drops below a normal operating voltage. In a test-mode, the |
| 5764574 |
Method and apparatus for back-end repair of multi-chip modules |
June 9, 1998 |
| A method and apparatus for independent redundancy programming of individual components of a multiple-component semiconductor device assembly. In the disclosed embodiment, a multiple-chip memory module includes a plurality of memory devices each having redundant circuitry therein for faci |
| 5744978 |
Variable load device responsive to a circuit parameter |
April 28, 1998 |
| A circuit for a sense amplifier (14) for use with a memory device (10). The circuit includes two devices (40 and 42) that are controlled by a selector (44). The first device (40) drives the sense amplifier (14) with a first current level. The second device (42) drives the sense amplifier |
| 5627785 |
Memory device with a sense amplifier |
May 6, 1997 |
| A circuit for a sense amplifier (14) for use with a memory device (10). The circuit includes two devices (40 and 42) that are controlled by a selector (44). The first device (40) drives the sense amplifier (14) with a first current level. The second device (42) drives the sense amplifier |
| 5619459 |
On-chip mobile ion contamination test circuit |
April 8, 1997 |
| A circuit for testing for mobile ion contamination of a semiconductor chip has an enabling circuit, a voltage pump, and a regulating circuit. In a normal operating mode, the voltage pump is enabled whenever the substrate voltage drops below a normal operating voltage. In a test-mode, the |
| 5566107 |
Programmable circuit for enabling an associated circuit |
October 15, 1996 |
| A circuit enables an associated function circuit in response to an activate signal. The enable circuit includes a zero-standby-current select circuit that may be programmed in either a select or unselect state. When programmed in a select state, the select circuit generates a select sign |
| 5345110 |
Low-power fuse detect and latch circuit |
September 6, 1994 |
| This invention is a low-power circuit for detecting and latching the state of a fusible link. During a power-up sequence, the circuit makes a one time determination regarding the blown or unblown status of a fuse element. In one embodiment of the invention, the circuit comprises a fuse |
