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Jasper Eaddy Patents |
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Inventor: Eaddy; Jasper
Address: Ft. Lauderdale, FL
No. of patents: 1
Patents:
| Patent Number |
Title Of Patent |
Date Issued |
| 5559445 |
Adapter for testing integrated circuits |
September 24, 1996 |
| A IC test adapter (100) for adapting the pin configuration of a chip carrier for use with test equipment. The IC test adapter (100) includes a case (101), printed circuit board (131), electrical contact pad(141), pin grid array (151) and bracket (161). |
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