Chip performance is measured using LSSD logic to propagate a signal through the LSSD scan path of the chip. The measurement data is compared to tabular data which is used to classify the AC chip performance. The use of the LSSD scan path provides an accurate overall measurement of an ent
In printed circuit boards having dense printed connections, cross talk noise immunity is significantly improved by preferentially routing adjacent to one another serially connected conductors of the same net rather than conductors of different nets. By such routing inter-net cross ta
An on-chip clock signal generator circuit is disclosed. The clock signal generator generates a high frequency clock signal in response to a system clock developed from a source located at a point external to the chip. The clock generator circuit includes an apparatus for stabilizing the
