A test circuit operable to examine both differential outputs and single outputs of a device under test (DUT), the circuit comprises a first circuit having as inputs a first output of the DUT and a first set of independent reference voltages, and an output of the first circuit coupled
A tester circuit generating differential signals, single ended signals, or a fast transitioning signal to exercise inputs of a device under test is described. According to one embodiment, the tester circuit includes a first circuit configured to generate a first test signal on an input o
