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Mark R. Breen Patents
Inventor:
Breen; Mark R.
Address:
Austin, TX
No. of patents:
2
Patents:




Patent Number Title Of Patent Date Issued
6473174 Resist removal monitoring by raman spectroscopy October 29, 2002
Various methods of inspecting a workpiece for residue are provided. In one aspect, a method of inspecting a workpiece for carbon residue includes directing coherent radiation at the workpiece to produce Rayleigh scattered radiation and Raman scattered radiation. The Rayleigh scattered
5508228 Compliant electrically connective bumps for an adhesive flip chip integrated circuit device and April 16, 1996
Compliant electrically connection bumps for an adhesive flip chip integrated circuit device and various methods for forming the bumps include the steps of forming polymer bumps on a substrate or an integrated circuit die and coating the polymer bumps with a metallization layer. The p


 
 
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