| Patent Number |
Title Of Patent |
Date Issued |
| 7194907 |
Method for measuring part thickness having an external coating using impedance matching delay li |
March 27, 2007 |
| An ultrasonic transducer for measuring a part with a coating having at least one acoustic transducer, and a buffer delay line having an impedance matched to an impedance of the coating. |
| 6393384 |
Apparatus and method for remote ultrasonic determination of thin material properties using signa |
May 21, 2002 |
| In an apparatus and method for remote ultrasonic determination of thin material properties using signal correlation, a method and apparatus are provided by which an arbitrarily-oriented anisotropic thin material may be interrogated for characterizing an unknown material property value |
| 6198097 |
Photocharge microscope |
March 6, 2001 |
| An apparatus and/or system is described which uses the photocharge voltage concept in lieu of optical scattering techniques to measure surface topology and properties of materials. The system is based on the measurement of a small electrical potential difference which appears on any |
| 5929338 |
Thickness measurement of in-ground culverts |
July 27, 1999 |
| A system which enables the user to measure continuously or intermittently or by remote command the thickness changes, above or below the water, under variable temperature changes of underground culverts with reliability. A liquid delay is used to couple the sound to the culvert compr |
| 5747693 |
System for taking transverse measurements |
May 5, 1998 |
| A system can take transverse measurements of an elongated workpiece. The tem has a base for holding the workpiece oriented in an axial direction. A carriage mounted on the base can move axially. This carriage has a linear measurement device for providing a linear signal signifying the |
| 5557970 |
Automated thickness measurement system |
September 24, 1996 |
| A method for and system of measuring the thickness of a component dimension f a sample material. Sound waves are coupled for transmission along a component direction of a sample material and also through first and second reference standards to provide first and second reference thicknesse |
| 5463896 |
Stress tester |
November 7, 1995 |
| A device is presented for measuring residual stresses in a solid component. he device includes a hardness measuring component which has an indenter for determining hardness at various locations. Stress (.sigma.) data is obtained by converting the hardness measurements according to the for |
