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Inventor:
Yoshida; Seikoh
Address:
Tokyo, JP
No. of patents:
8
Patents:




Patent Number Title Of Patent Date Issued
6897495 Field effect transistor and manufacturing method therefor May 24, 2005
GaN-based FET has a sapphire substrate of about 50 nm thick on which an n-type GaN electron transit layer and an Al.sub.0.2 Gao.sub.0.8 N electron supply layer are formed, together with n.sup.+ -type GaN contact regions sandwiching the electron transit and supply layers therebetween. On
6768146 III-V nitride semiconductor device, and protection element and power conversion apparatus using July 27, 2004
A GaN-based Schottky diode includes a sapphire substrate on which are formed a GaN buffer layer, an n.sup.+ -type GaN layer, and an n-type GaN layer that has a surface portion thereof shaped to form a protrusion having an upper face with which a Ti electrode forms a Schottky junction
6674101 GaN-based semiconductor device January 6, 2004
A GaN-based semiconductor device made of GaN-based semiconductor materials includes a bank made of a first undoped material and formed on a base layer, a thin layer made of a second undoped material having higher band-gap energy than the first undoped material and formed on a side wall
6580101 GaN-based compound semiconductor device June 17, 2003
A semiconductor device having a high breakdown and capable of operating with a large current is realized using GaN-based compound semiconductors which exhibit good electric characteristics. Particularly, a semiconductor material having a larger band gap than semiconductor materials formi
6576927 Semiconductor device and GaN-based field effect transistor for use in the same June 10, 2003
The present invention provides a semiconductor device as an FET integrated object having a small effective area, a small ON resistance during operation, a high voltage resistance, and capable of large-current drive. This device comprises one or more FET's each having a gate electrode, a
6534801 GaN-based high electron mobility transistor March 18, 2003
A GaN-based high electron mobility transistor (HEMT) has an undoped GaN layer where a two-dimensional electron gas layer is formed, the undoped GaN layer having a high electric resistivity enabling a pinch-off state to be obtained even when the gate bias voltage is 0 V. The GaN-based HEM
6396085 GaN-type semiconductor vertical field effect transistor May 28, 2002
A vertical field effect transistor having an MES-type structure high in withstand voltage and capable of high current operation is realized through effective use of GaN-type semiconductors. Specifically, a source electrode and a drain electrode are formed on the top and the bottom of a
5342475 Method of growing single crystal of compound semiconductor August 30, 1994
Disclosed is a method of growing a single crystal of a compound semiconductor, in which a compound semiconductor material is loaded in a vertical crucible and the compound semiconductor material is converted into a single crystal by utilizing a seed disposed in the center of the bott


 
 
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