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Yamamori; Nobuaki
Tokyo, JP
No. of patents:

Patent Number Title Of Patent Date Issued
5675265 Method of measuring delay time in semiconductor device October 7, 1997
A method of measuring a delay time in a semiconductor device which has a particular circuit subject to delay time measurement, a test circuit coupled to an input terminal of the particular circuit for bypassing the particular circuit, and a selector for selectively outputting either an

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