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Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Inventor:
Yamaguchi; Masao
Address:
Tokyo, JP
No. of patents:
32
Patents:












Patent Number Title Of Patent Date Issued
RE41329 Machining apparatus for workpiece and method therefor May 11, 2010
To provide an apparatus that may impart a complicated bend deformation to an object to be machined such as a ceramic bar elongated in one direction or the like, and may reduce the non-uniformity in machining amount of the object to be machined upon the machining work of the object to be
8049945 Optical beam scanning device and image forming apparatus provided with the same November 1, 2011
A technique is provided which can improve optical characteristics by suppressing the occurrence of an error in attachment of a rotary deflector that deflects a light flux from a light source and scans it in a main scanning direction. There are provided a rotary deflector that deflect
7991317 Automatic job template generating apparatus and automatic job template generation method August 2, 2011
In order to provide an automatic job template generating apparatus capable of making operations simpler by reducing the steps in the user interface operation to match a frequently used capability of an MFP, an automatic job template generating apparatus of the invention is formed of
7982894 Digital multiple apparatus July 19, 2011
In a digital multiple apparatus, at least two different jobs are processed by at least two job processing units, and while job processing by one job processing unit, if there is an interruption by job processing by the other job processing unit, an end time of the job processing by t
7508565 Optical beam scanning apparatus, method of manufacturing optical beam scanning apparatus, image March 24, 2009
In an image forming apparatus according to the invention, an optical beam scanning apparatus of an overillumination scanning optical system includes a laser, a pre-deflection optical system, a polygon mirror, and a post-deflection optical system, wherein the post-deflection optical s
7468823 Optical beam scanning device, image forming apparatus and lens December 23, 2008
An optical beam scanning device of the invention includes a single light deflection device, a pre-deflection optical system which causes a light beam emitted from a light source to be incident to the light deflection device, and a post-deflection optical system which images the light bea
7119935 Light scanning unit for use in image forming apparatus October 10, 2006
A light scanning unit according to the present invention can decrease the degree of change when the quantity of light is changed on a photoconductor, thereby decreasing an image density difference occurred when forming an image.
6992689 Light scanning unit for use in image forming apparatus January 31, 2006
A light scanning unit of the present invention can reduce the degree of variation in the quantity of light on a photosensitive body by a scanning position and can reduce a difference in density of an image which occurs at image formation.
6980342 Optical beam scanning device December 27, 2005
An optical beam scanning device 21 includes a pre-deflection optical system 40 for adjusting a laser beam L emitted from a semiconductor laser element 41 so as to be focused as a line image longitudinally extending in a direction corresponding to a main scanning direction, a polygon mirr
6888655 Optical beam scanning device May 3, 2005
An optical beam scanning device comprises optical beam scanning means for rotational polygonal mirror to deflect entering luminous flux and scan an object to be scanned with the luminous flux; pre-deflection optical system which shapes a luminous flux emitted from light source means to i
6859678 METHOD AND APPARATUS FOR MANUFACTURING MAGNETORESISTIVE ELEMENT, SOFTWARE AND SYSTEM FOR CONTROL February 22, 2005
Provided are a method and an apparatus for manufacturing a magnetoresistive element and a method and an apparatus for manufacturing a magnetic head which can reduce variation in properties of an magnetoresistive element and variation in the median of distribution.Before starting polishin
6839076 Light scanning unit for use in image forming apparatus January 4, 2005
A light scanning unit of the present invention can reduce the degree of variation in the quantity of light on a photosensitive body by a scanning position and can reduce a difference in density of an image which occurs at image formation.
6767275 Machining apparatus for workpiece and method therefor July 27, 2004
To provide an apparatus that may impart a complicated bend deformation to an object to be machined such as a ceramic bar elongated in one direction or the like, and may reduce the non-uniformity in machining amount of the object to be machined upon the machining work of the object to be
6623336 Magnetic head polishing device and method thereof September 23, 2003
When electric elements are formed on a ceramic bar or the like, the positional displacement of the respective elements occurs due to a division exposing process or the like. An object of the present invention is to provide a device and a method which unify the non-polished portion of
6500049 Lapping oil composition for finish-grinding December 31, 2002
The present invention relates to a lapping oil composition which is advantageously used in finish-grinding of a material to provide a high-quality grinding surface, without selective grinding, which is generally caused during lapping and polishing processes of the composite material.
6497611 Method of polishing a magnetic head slider December 24, 2002
Disclosed is a method of polishing a magnetic head slider whereby a by-processed step can be easily reduced. An air bearing surface of the magnetic head slider is polished with setting a bar that includes the magnetic head slider where a thin film magnetic head element is formed to r
6383239 Free abrasive slurry composition and a grinding method using the same May 7, 2002
The present invention relates to a free abrasive slurry composition which is advantageously used in uniform grinding of a composite material composed of a plurality of materials each having different hardness, without causing selective grinding. The free abrasive slurry composition c
6361399 Slider processing apparatus, load applying apparatus and auxiliary device for processing slider March 26, 2002
It is an object of the invention to prevent a lapping member from being cut by an edge of a slider when the edge is chamfered by lapping it with the lapping member.A slider held by a slider holding jig according to the invention is put in contact with a diamond lapping sheet. A load appl
6257959 Apparatus and method for processing slider, load applying apparatus and auxiliary device for pro July 10, 2001
It is an object of the invention to prevent a lapping member from being cut by an edge of a slider when the edge is chamfered by lapping it with the lapping member. A slider held by a slider holding jig according to the invention is put in contact with a diamond lapping sheet. A load app
5614837 Probe apparatus and burn-in apparatus March 25, 1997
A loader section for supplying semiconductor wafers is arranged at one end of a linear first convey path for a convey unit. Burn-in test sections, probe test sections, a laser repair section, a deposition repair section, a marking section, a baking section, and visual test sections are a
5539676 Method of identifying probe position and probing method in prober July 23, 1996
A prober for a semiconductor wafer includes a probe card mounted in a card mounting opening and having a plurality of probes. A work table for placing a wafer thereon and movable in X, Y, Z, and .theta. directions is disposed under the probe card. The work table includes a camera, and it
5530374 Method of identifying probe position and probing method in prober June 25, 1996
A marker is provided outside the probe arrangement region of the lower surface of a probe card. In identifying positions of probes, the marker is recognized by a camera before the distal end of a reference probe is recognized. The camera is then moved from the position of the marker base
5521522 Probe apparatus for testing multiple integrated circuit dies May 28, 1996
There is provided a probe apparatus with a stage for holding a wafer on which a plurality of chips are regularly arranged such that the chips are arranged substantially in an XY plane, a large number of contactors facing the wafer held on the stage, provided to corresponding to respectiv
5517126 Probe apparatus May 14, 1996
A probe apparatus for measuring electrical characteristics of an object to be tested by putting a plurality of probes in electrical contact with the object comprises an apparatus body, a probe card having a plurality of probes, and a probe card holder for holding the probe card at a
5510724 Probe apparatus and burn-in apparatus April 23, 1996
A loader section for supplying semiconductor wafers is arranged at one end of a linear first convey path for a convey unit. Burn-in test sections, probe test sections, a laser repair section, a deposition repair section, a marking section, a baking section, and visual test sections are a
5422579 Method of identifying probe position and probing method in prober June 6, 1995
A marker is provided outside the probe arrangement region of the lower surface of a probe card. In identifying positions of probes, the marker is recognized by a camera before the distal end of a reference probe is recognized. The camera is then moved from the position of the marker base
5301077 Thin film magnetic head April 5, 1994
At the time of polishing an air bearing surface 12 the edge of the air bearing surface 12 is simultaneously beveled to form edge surfaces 14. The air bearing surface 12 is preferably constituted as a flat planar surface 121 having a tapered surface 122 continuous therewith at the air inf
5234357 Lock mechanism for electrical connector August 10, 1993
A lock mechanism for an electrical connector includes a pair of extended sections (41) each having a lock projection (48) for engagement with a lock hole (5) of a mating electrical connector; a linking arm (44) for connecting said extended sections; a pair of press-fit portions (43) with
4906208 Electrical connector March 6, 1990
An electrical connector includes a receptacle connector having a first insulating housing containing a plurality of first contacts and a first shielding shell disposed so as to enclose contact portions of the first contacts; a plug connector including a second insulating housing cont
4789357 Electrical connector shield case December 6, 1988
An electrical connector shield case for enclosing an insulation member having a plurality of contacts, which comprises a cylindrical member made by bending a metal piece so as to enclose said insulation member; and said cylindrical member having locking means on opposite ends of said met
4753608 Electrical connector and its termination method June 28, 1988
An electrical connector for terminating two or more layers of conductors includes an insulating housing having a plurality contacts mounted therein and, on opposite ends, a pair of latch arms with a latch opening, and first and second cable retainer members. The first retainer member has
4718866 Electrical connector shield case and method of making same January 12, 1988
An electrical connector shield case for covering either protuberance or opening of an insulating housing with a plurality of contacts therein, which comprises a cylindrical metal member; at least one boss provided on the side of said cylindrical member so as to make shielding contact wit










 
 
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