| Patent Number |
Title Of Patent |
Date Issued |
| 7554722 |
Scanning microscope with scanner frequency derived from pulsed laser |
June 30, 2009 |
| A scanning microscope (1) and a scanning method are disclosed. The scanning microscope (1) has, arranged in the illuminating light beam path (3), an outcoupling element (60) that couples out at least a fraction of the illuminating light beam (3) and directs it to a detector (61) that |
| 7495236 |
Apparatus and method for detection with a scanning microscope |
February 24, 2009 |
| An apparatus and a method for detection with a scanning microscope (1) are disclosed. The scanning microscope (1) encompasses a scanning device (7) that guides an illuminating light beam (3) through a scanning optical system (12) and a microscope optical system (13) and over or through a |
| 7492511 |
Scanning microscope |
February 17, 2009 |
| The invention relates to a scanning microscope comprising a beam deflecting device (11), which directs an illuminating light beam (5) over or through a sample (21), and comprising a detector (33) for receiving detection light (23) exiting the sample. The scanning microscope comprises |
| 7345800 |
Optical arrangement for deflecting a light beam |
March 18, 2008 |
| An optical arrangement for deflecting a light beam includes first and second deflection devices, and a coupling mirror. The first deflection device is rotatable about a first axis using a first rotary drive, and includes two mirrors disposed non-rotatably with respect to each other in |
| 7190451 |
Detection device |
March 13, 2007 |
| A detection device includes a spectral splitting device located in a detection beam path for spectrally splitting detection light into individual spectral components. A deflection device is located downstream of the spectral splitting device for deflecting the individual spectral com |
| 6914238 |
Method and apparatus for point-by-point scanning of a specimen |
July 5, 2005 |
| A method and an apparatus for point-by-point scanning of a specimen (15) are disclosed. The method is characterized by the steps of generation (45) of a nominal signal (10) for each scan point and transfer (47) of the nominal signal to a scanning device (7). In further steps, determinati |
| 6894271 |
Method for operating a positioning apparatus, and scanning microscope |
May 17, 2005 |
| A method for operating a positioning apparatus that moves a positioning element comprises the steps of: generating a first and at least one further reference signal, the first reference signal corresponding to a first reference position and the further reference signal to a further r |
| 6859294 |
Method for ascertaining position values, and scanning microscope |
February 22, 2005 |
| A scanning microscope is disclosed. The scanning microscope comprises a light source which emits an illuminating light beam for illumination of a specimen, a resonant beam deflection device, for guiding the illuminating light beam over the specimen, which has a resonant frequency and a |
| 6444971 |
Method and system for compensating intensity fluctuations of an illumination system in a confoca |
September 3, 2002 |
| A method and system for compensating intensity fluctuations of an illumination system in a confocal microscope comprise a first and a second analog-to-digital converters for digitizing a first electrical signal corresponding to the light reflected from a specimen, and for digitizing a |
| 6423960 |
Method and system for processing scan-data from a confocal microscope |
July 23, 2002 |
| The invention discloses a method and system for processing scan signals from a confocal microscope. The confocal microscope comprises an illumination source and a scanning device with a scanning mirror system. A control and processing unit is provided, which unit uses a plurality of |
