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Inventor: Tachikawa; Yoshihiko
Address: Tokyo, JP
No. of patents: 3
Patents:
| Patent Number |
Title Of Patent |
Date Issued |
| 6008487 |
Optical-fiber inspection device |
December 28, 1999 |
| In the primary invention of this application, an optical-fiber inspection device which detects the distance to a reflection point within the DUT and the amount of reflected light by dividing into two a laser beam which is possible to be frequency-swept, making one of the divided light be |
| 5933235 |
Optical spectrum analyzer and spectrometer |
August 3, 1999 |
| A first invention of the present application is an optical spectrum analyzer comprising a spectrometer apparatus an arithmetic unit for calculating the center wavelength from output signals from photo detector devices of a device array included in the spectrometer apparatus and from |
| 5844235 |
Optical frequency domain reflectometer for use as an optical fiber testing device |
December 1, 1998 |
| In the primary invention of this application, an optical-fiber inspection device which detects the distance to a reflection point within the DUT and the amount of reflected light by dividing into two a laser beam which is possible to be frequency-swept, making one of the divided light be |
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