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Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Inventor:
Sugimura; Hajime
Address:
Saitama, JP
No. of patents:
1
Patents:












Patent Number Title Of Patent Date Issued
8149721 Test apparatus and test method April 3, 2012
There is provided a test apparatus for testing a device under test, including an obtaining section that obtains a packet sequence communicated between the test apparatus and the device under test, from a simulation environment for simulating an operation of the device under test, a p










 
 
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