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Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Inventor:
Saida; Shigehiko
Address:
Yokkaichi, JP
No. of patents:
6
Patents:












Patent Number Title Of Patent Date Issued
7612401 Non-volatile memory cell November 3, 2009
A semiconductor device comprises a semiconductor substrate, and a non-volatile memory cell provided on the semiconductor substrate, the non-volatile memory cell comprising a tunnel insulating film having a film thickness periodically and continuously changing in a channel width direc
7541233 Semiconductor device and method of manufacturing the same June 2, 2009
A semiconductor device comprises a semiconductor substrate, and a non-volatile memory cell provided on the semiconductor substrate, the non-volatile memory cell comprising a tunnel insulating film having a film thickness periodically and continuously changing in a channel width direc
7148158 Semiconductor device and method for manufacturing the same December 12, 2006
A semiconductor device includes a semiconductor device comprising a semiconductor substrate, source/drain regions formed in the semiconductor substrate, a gate insulation film formed on the semiconductor substrate, a gate electrode formed on the gate insulation film between the sourc
7081386 Semiconductor device and method of manufactuing the same July 25, 2006
A semiconductor device comprises a semiconductor substrate, and a non-volatile memory cell provided on the semiconductor substrate, the non-volatile memory cell comprising a tunnel insulating film having a film thickness periodically and continuously changing in a channel width direc
6903422 Semiconductor integrated circuits, fabrication method for the same and semiconductor integrated June 7, 2005
A semiconductor integrated circuit is disclosed, which includes a semiconductor substrate, a memory cell formed on the semiconductor substrate and having a first gate insulating layer of a stacked structure which includes a silicon nitride layer to become a charge storage layer, and
6772045 System for determining dry cleaning timing, method for determining dry cleaning timing, dry clea August 3, 2004
A system for determining dry cleaning timing, includes: a manufacturing apparatus configured to process materials assigned by a sequence of lots; an apparatus controller configured to control the manufacturing apparatus and obtaining operational conditions of the manufacturing apparatus










 
 
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