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Inventor: Saab; Daniel
Address: University Heights, OH
No. of patents: 1
Patents:
| Patent Number |
Title Of Patent |
Date Issued |
| 5831996 |
Digital circuit test generator |
November 3, 1998 |
| Automatic test pattern generator for generating test patterns that are capable of detecting faults in a digital combinational circuit comprises a first forward network capable of emulating the digital combinational circuit; a second forward network capable of emulating the digital co |
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