| Patent Number |
Title Of Patent |
Date Issued |
| 7602958 |
Mirror node process verification |
October 13, 2009 |
| An inspection image analysis system. At least one image processing computer is configured to receive and analyze at least one portion of an image. At least one test computer is configured to receive at least one common portion of the image also received by the at least one image proc |
| 7555409 |
Daisy chained topology |
June 30, 2009 |
| An inspection system. The inspection system has a sensor for generating data. A first network is coupled to the sensor and communicates the data. An array of nodes is coupled to the first network, and processes the data to produce reports. Each node has an interface coupled to the first |
| 7379838 |
Programmable image computer |
May 27, 2008 |
| An inspection system for detecting anomalies on a substrate. A first network is coupled to a sensor array and communicates data. Process nodes are coupled to the first network, and process the data to produce reports. Each process node has an interface card that formats the data for |
| 7251586 |
Full swath analysis |
July 31, 2007 |
| An inspection system for detecting anomalies on a substrate. A first network is coupled to the sensor array and communicates image data. Process nodes are couple to the first network, and process the data to produce reports. Each process node has an interface card that formats the da |
| 7181368 |
Status polling |
February 20, 2007 |
| An inspection system for detecting anomalies on a substrate. The inspection system has a sensor array for generating image data. A first high speed network is coupled to the sensor array and receives and communicates the image data. An array of process nodes is coupled to the first h |
| 7149642 |
Programmable image computer |
December 12, 2006 |
| An inspection system for detecting anomalies on a substrate. A first network is coupled to a sensor array and communicates data. Process nodes are coupled to the first network, and process the data to produce reports. Each process node has an interface card that formats the data for |
| 7076390 |
Memory load balancing |
July 11, 2006 |
| An inspection system for detecting anomalies on a substrate. A first network is coupled to a sensor array and communicates data. Process nodes are coupled to the first network, and process the data to produce reports. Each process node includes memory sufficient to buffer the data un |
| 7024339 |
Full swath analysis |
April 4, 2006 |
| An inspection system for detecting anomalies on a substrate. A first network is coupled to a sensor array and communicates image data. Process nodes are coupled to the first network, and processes the data to produce reports. Each process node has an interface card that formats the data |
