| Patent Number |
Title Of Patent |
Date Issued |
| 7385383 |
Methods and systems for determining efficacy of stress protection circuitry |
June 10, 2008 |
| Methods and systems are provided for determining efficacy of stress protection circuitry. The methods and systems employ a ring oscillator that models at least one parameter of a functional circuit to be protected by the stress protection circuit. A stress signal is applied to the ri |
| 7196887 |
PMOS electrostatic discharge (ESD) protection device |
March 27, 2007 |
| A PMOS ESD protection device is disclosed in which gate and substrate coupling techniques are implemented to afford protection during positive ESD events. A snapback leg in curves capable of being produced in accordance with one or more aspects of the present invention is removed, an |
| 7026838 |
Versatile system for accelerated stress characterization of semiconductor device structures |
April 11, 2006 |
| The present invention provides a system (200) for performing accelerated stress characterization of a given transistor (204). Inverter circuits, formed from the given transistor, are disposed in series with one another (202). A plurality of signal taps is operatively associated with each |
| 6933731 |
Method and system for determining transistor degradation mechanisms |
August 23, 2005 |
| According to one embodiment, a method for isolating degradation mechanisms in transistors includes providing a ring oscillator having a plurality of delay elements. Each delay element operates as a delay element through the use of one or more transistors of only a first type and no trans |
