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Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Inventor:
Raha; Prasun
Address:
San Mateo, CA
No. of patents:
1
Patents:




Patent Number Title Of Patent Date Issued
7026838 Versatile system for accelerated stress characterization of semiconductor device structures April 11, 2006
The present invention provides a system (200) for performing accelerated stress characterization of a given transistor (204). Inverter circuits, formed from the given transistor, are disposed in series with one another (202). A plurality of signal taps is operatively associated with each


 
 
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