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Inventor:
Oguchi; Takahiro
Address:
Kanagawa, JP
No. of patents:
11
Patents:












Patent Number Title Of Patent Date Issued
7794299 Method for manufacturing image display device, image display device, and TV apparatus September 14, 2010
A method for manufacturing an image display device includes the steps of preparing a plurality of spacers preliminarily, measuring heights of the plurality of spacers prepared by the preparing step individually, and deciding an order of arranging the spacers on the basis of the measured
7390235 Method for manufacturing image display device, image display device, and TV apparatus June 24, 2008
A method manufactures an image display device including a rear plate having a plurality of electron emitting devices arranged thereon, a face plate arranged opposite the rear plate, an outer frame arranged between the rear plate and the face plate and supporting peripherals of the rear
7388561 Characteristics adjustment method of image forming apparatus, manufacturing method of image form June 17, 2008
There is provided a characteristic adjustment method for an image forming apparatus that is provided with a multi-electron source in which a plurality of electron-emitting devices are electrically connected by wiring and arranged on a substrate and a fluorescent member for emitting l
7088036 Method for manufacturing image display device, image display device, and TV apparatus August 8, 2006
An image display device of a high quality, in which the variation of heights between adjoining spacers is reduced by measuring the heights of spacers to arrange the spacers from the end in the sequential order of heights so that the mechanical precision of the spacers need not be str
6958578 Method and apparatus for adjusting characteristics of multi electron source October 25, 2005
The electron emission characteristics and adjustment times of a multi electron source are made approximately equal with simple processes. A characteristics adjustment method for a multi electron source having a plurality of electron emitting devices disposed on a substrate, comprising
6890229 Method and apparatus for adjusting characteristics of electron source, and method for manufactur May 10, 2005
A method for adjusting characteristics of an electron source having a plurality of electron-emitting devices, and a method for manufacturing the electron source include the step of applying a pulse of a voltage for adjustment to an electron-emitting device to be adjusted one or more time
6888519 Characteristics adjustment method of image forming apparatus, manufacturing method of image form May 3, 2005
There is provided a characteristic adjustment method for an image forming apparatus that is provided with a multi-electron source in which a plurality of electron-emitting devices are electrically connected by wiring and arranged on a substrate and a fluorescent member for emitting l
6851995 Method of manufacturing an electron source February 8, 2005
It relates to a method of manufacturing an electron source. In an activation process, a set value of an activation gas partial pressure is switched at multi-stages and an application of a compensation voltage is not conducted for a predetermined period after switching of the set value.
6760001 Method of adjusting characteristics of electron source, method of manufacturing electron emissio July 6, 2004
The present application discloses a characteristic adjusting method of executing a step of changing the characteristics of display devices in an image display apparatus. In particular, the present invention discloses a configuration in which target values for changes in characteristics a
6712660 Method and apparatus for adjusting characteristics of electron source, and method for manufactur March 30, 2004
A method for adjusting characteristics of an electron source having a plurality of electron-emitting devices, and a method for manufacturing the electron source include the step of applying a pulse of a voltage for adjustment to an electron-emitting device to be adjusted one or more time
6661179 Method and apparatus for adjusting characteristics of multi electron source December 9, 2003
A method for adjusting electron emitting characteristics of a multi-electron source having plural electron emitting devices disposed on a substrate. The method comprises measuring electron emission characteristics of the devices and setting a characteristic adjustment target value. P










 
 
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