| Patent Number |
Title Of Patent |
Date Issued |
| D354923 |
Probing head for an electrical test probe |
January 31, 1995 |
|
| D346338 |
Electrical test probe |
April 26, 1994 |
|
| D346122 |
Probing head for an electrical test probe |
April 19, 1994 |
|
| D344681 |
Head assembly for a switchable electrical test probe |
March 1, 1994 |
|
| 7362112 |
Signal acquisition probe having a retractable double cushioned probing tip assembly |
April 22, 2008 |
| A signal acquisition probe has a double cushioned spring loaded probing tip assembly disposed in a housing. A first compressive element produces a first pre-loaded compressive force and an increasing compressive force on the probing tip assembly and a second compressive element produces |
| 6989492 |
Inverted strain relief |
January 24, 2006 |
| An inverted strain relief for receiving a coaxial cable has a housing with a bore therethrough defining first and second apertures in opposing surfaces of the housing. The bore surface is defined by at least a first radius scribing an arc from the perimeter of the first aperture to the |
| 6659812 |
Surface mount probe point socket and system |
December 9, 2003 |
| A surface mount probe point socket has a housing with base and a socket extending from the base. The base has a length and width sufficient for attaching the housing to a circuit trace using an electrically conductive material while adding minimal inductance and capacitance to the circui |
| 6614221 |
Deskew fixture |
September 2, 2003 |
| A deskew fixture has a multilayer circuit board from which pairs of mirrored signal launch contact extend from both sides of the circuit board. One pair of contacts is coupled to electrical ground and the other pair is connected via equal length, electromagnetically coupled strip lin |
| 6603297 |
Probe tip adapter for a measurement probe |
August 5, 2003 |
| A probe tip adapter for a measurement probe has at least a first electrically conductive element with a bore at one end and a probing contact formed on the other end. The bore of the electrically conductive element has an electrically conductive elastomer disposed therein having suff |
| 6600330 |
Probe head holder |
July 29, 2003 |
| A probe head holder for a measurement probe head has a probe head mount and a highly elastic, high hoop strength retention member that flexibly secures the measurement probe head to the probe head holder. The probe head mount has a first surface adapted to receive the measurement probe |
| 6466000 |
Replaceable probe tip holder and measurement probe head |
October 15, 2002 |
| A replaceable probe tip holder for an associated low capacitance probe head has a cap with a series of cavities formed therein and a bore extending from the inter most cavity to the front end of the cap. A first cavity receives the probe head tubular housing, a second cavity receives a |
| 6459287 |
Attachable/detachable probing point |
October 1, 2002 |
| An attachable/detachable probe point for use with an electrical measurement probe includes a base having a aperture formed therein that extends through the base. An electrically conductive probing contact having at least a partially threaded body member and a pointed contact member is |
| 6404215 |
Variable spacing probe tip adapter for a measurement probe |
June 11, 2002 |
| A variable spacing probe tip adapter for a differential measurement probe has a measurement probe head with first and second probe tips extending from the probe head. Ribs and grooves formed in the probe head that extend radially from around each of the probe tips. Each of first and seco |
| 6402565 |
Electronic interconnect device for high speed signal and data transmission |
June 11, 2002 |
| An electronic interconnect assembly has a high speed coaxial interconnect for a coaxial transmission line having a central signal conductor and a surrounding shield conductor. The coaxial interconnect has a male side and a female side, with the female side including a shield sleeve havin |
| 6400167 |
Probe tip adapter for a measurement probe |
June 4, 2002 |
| A probe tip adapter for a measurement probe has at least a first electrically conductive element with a bore at one end and a probing contact formed on the other end. The bore of the electrically conductive element has an electrically conductive elastomer disposed therein having suff |
| 6218826 |
Measurement probe having an internal alignment fixture |
April 17, 2001 |
| A measurement probe includes a sacrificial assembly fixture as part of the probe head. The probe head has probing contact at one end thereof and a transmission cable extending from the other end thereof and includes a housing having interior surfaces with the probing contact disposed in |
| 6191594 |
Adapter for a measurement test probe |
February 20, 2001 |
| A probe adapter for coupling probe tip contacts of a electrical measurement probe to leads of a surface mounted integrated circuit IC device has an insulating housing from which extend first and second flexible electrically conductive leads having a pitch geometry compatible with the |
| 6175080 |
Strain relief, pull-strength termination with controlled impedance for an electrical cable |
January 16, 2001 |
| A strain relief and pull-strength termination with controlled impedance for a transmission cable has a carrier with a flat portion for accepting one end of the cable and tabs extending from the flat portion. The cable is secured to the flat portion via soldering of the shielding conducto |
| 5387872 |
Positioning aid for a hand-held electrical test probe |
February 7, 1995 |
| An apparatus for directly positioning a hand-held electrical test probe onto leads of a surface mounted integrated circuit, IC, device has a housing with a central bore therethrough for receiving the probing tip of the test probe, which is coupled to compensation circuitry in the probing |
| 5220274 |
Surface mounted electrical switch and probe structure |
June 15, 1993 |
| An electrical switch usable in an electrical test probe has electrical contact pads formed on a substrate acting as fixed electrical switch contacts. A frame member is laterally disposed from the fixed electrical switch contacts. An actuator is disposed within the frame member having a |
