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Inventor:
Nakayama; Hiroyuki
Address:
Nirasaki, JP
No. of patents:
18
Patents:




Patent Number Title Of Patent Date Issued
7566379 Method and apparatus for an improved upper electrode plate with deposition shield in a plasma pr July 28, 2009
The present invention presents an improved upper electrode for a plasma processing system, wherein the design and fabrication of an electrode plate with a deposition shield coupled to the upper electrode advantageously provides gas injection of a process gas with substantially minima
7566368 Method and apparatus for an improved upper electrode plate in a plasma processing system July 28, 2009
The present invention presents an improved upper electrode for a plasma processing system, wherein the design and fabrication of an electrode plate coupled to an upper assembly advantageously provides gas injection of a process gas with substantially minimal erosion of the electrode
7560083 Method for removing water molecules from vacuum chamber, program for executing the method, and s July 14, 2009
A method for removing water molecules from a vacuum chamber for carrying out a process on a target object in vacuum includes the steps of introducing into the vacuum chamber a water molecule removal gas including at least a reduction gas which reduces the water molecules to produce h
7553378 Substrate cleaning apparatus and method June 30, 2009
A substrate cleaning apparatus includes a chamber for accommodating a substrate; a mounting table, disposed in the chamber, for mounting thereon the substrate; an electrode disposed in the mounting table, the substrate being attracted and held on the mounting table as a voltage is ap
7464581 Vacuum apparatus including a particle monitoring unit, particle monitoring method and program, a December 16, 2008
It is an object to provide a vacuum apparatus capable of evaluating its cleanness precisely by surely monitoring particles including deposits readily detached from the apparatus, and a particle monitoring method and program employed therein, and a window member for particle monitoring.A
7458247 Vacuum apparatus including a particle monitoring unit, particle monitoring method, and program December 2, 2008
A semiconductor manufacturing apparatus includes a processing chamber for performing a manufacturing processing on a wafer. A gas supply line for introducing a purge gas is connected to an upper portion of the processing chamber, a valve being installed on the gas supply line. A roug
7347006 Processing apparatus and method for removing particles therefrom March 25, 2008
A processing apparatus includes a first detection unit for detecting a temperature of an inner wall of the vacuum vessel, a second detection unit for detecting a temperature of the processing unit, and a first control unit for controlling a temperature of the gas. The first control u
7299104 Substrate processing apparatus and substrate transferring method November 20, 2007
Shock waves occurring when opening a gate valve between two vacuum chambers and peeling of particles by a viscous force taking place when a gas is supplied into a vacuum chamber are necessary to be suppressed by the apparatus and method of the invention, whereby contamination of a su
7282112 Method and apparatus for an improved baffle plate in a plasma processing system October 16, 2007
The present invention presents an improved baffle plate for a plasma processing system, wherein the design and fabrication of the baffle plate advantageously provides for a uniform processing plasma in the process space with substantially minimal erosion of the baffle plate.
7204912 Method and apparatus for an improved bellows shield in a plasma processing system April 17, 2007
The present invention presents an improved bellows shield for a plasma processing system, wherein the design and fabrication of the bellows shield coupled to a substrate holder electrode advantageously provides protection of a bellows with substantially minimal erosion of the bellows
7166200 Method and apparatus for an improved upper electrode plate in a plasma processing system January 23, 2007
The present invention presents an improved upper electrode for a plasma processing system, wherein the design and fabrication of an electrode plate coupled to an upper assembly advantageously provides gas injection of a process gas with substantially minimal erosion of the electrode
7166166 Method and apparatus for an improved baffle plate in a plasma processing system January 23, 2007
The present invention presents an improved baffle plate for a plasma processing system, wherein the design and fabrication of the baffle plate advantageously provides for a uniform processing plasma in the process space with substantially minimal erosion of the baffle plate.
7163585 Method and apparatus for an improved optical window deposition shield in a plasma processing sys January 16, 2007
The present invention presents an improved optical window deposition shield for optical access to a process space in a plasma processing system through a deposition shield, wherein the design and fabrication of the optical window deposition shield advantageously provides an optically
7147749 Method and apparatus for an improved upper electrode plate with deposition shield in a plasma pr December 12, 2006
The present invention presents an improved upper electrode for a plasma processing system, wherein the design and fabrication of an electrode plate with a deposition shield coupled to the upper electrode advantageously provides gas injection of a process gas with substantially minima
7137353 Method and apparatus for an improved deposition shield in a plasma processing system November 21, 2006
The present invention presents an improved deposition shield for surrounding a process space in a plasma processing system, wherein the design and fabrication of the deposition shield advantageously provides for a clean processing plasma in the process space with substantially minima
6837966 Method and apparatus for an improved baffle plate in a plasma processing system January 4, 2005
The present invention presents an improved baffle plate for a plasma processing system, wherein the design and fabrication of the baffle plate advantageously provides for a uniform processing plasma in the process space with substantially minimal erosion of the baffle plate.
6798519 Method and apparatus for an improved optical window deposition shield in a plasma processing sys September 28, 2004
The present invention presents an improved optical window deposition shield an improved optical window deposition shield for optical access to a process space in a plasma processing system through a deposition shield, wherein the design and fabrication of the optical window deposition sh
6790289 Method of cleaning a plasma processing apparatus September 14, 2004
There is provided a method of cleaning completely a deposit on the surface of the member to be cleaned, of a plasma processing apparatus without any damage of the coating which has been formed anodized coating or sprayed coating on the surface of the member to cleaned. The method of clea


 
 
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