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Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Inventor:
Nakayama; Hiroyasu
Address:
Saitama, JP
No. of patents:
3
Patents:












Patent Number Title Of Patent Date Issued
8165027 Test apparatus and test method April 24, 2012
There is provided a test apparatus for testing at least one device under test, including a packet list storing section that stores a plurality of packet lists each of which includes a series of packets communicated between the test apparatus and the at least one device under test, a flow
8149721 Test apparatus and test method April 3, 2012
There is provided a test apparatus for testing a device under test, including an obtaining section that obtains a packet sequence communicated between the test apparatus and the device under test, from a simulation environment for simulating an operation of the device under test, a p
8059547 Test apparatus and test method November 15, 2011
Provided is a test apparatus that tests a device under test, comprising an upper sequencer that sequentially designates packets transmitted to and from the device under test, by executing a test program for testing the device under test; a packet data sequence storing section that stores










 
 
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