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Inventor:
Nada; Hiroshi
Address:
Tokyo, JP
No. of patents:
2
Patents:












Patent Number Title Of Patent Date Issued
7812619 Capacitance measuring apparatus and capacitance measuring method October 12, 2010
A capacitance measuring apparatus which comprises: a voltage source for applying voltage fluctuation to a device under test; a current source for absorbing the current flowing through the resistance component of the device under test; and an ammeter for measuring the leakage current
5285151 Method and apparatus for measuring the breakdown voltage of semiconductor devices February 8, 1994
A ramp voltage is applied through a current limiter 2 to a DUT 3. Setting as a reference time point (t.sub.1) a time when a ramp portion of the response voltage V of the DUT 3 has settled to a prescribed value (for example, when the voltage gradient is reduced by a predetermined rate to










 
 
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