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Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Inventor:
Murakami; Satoshi
Address:
Kanagawa, JP
No. of patents:
51
Patents:


1 2


Patent Number Title Of Patent Date Issued
7554116 Display device June 30, 2009
A display device according to the present invention includes: a planarization layer for insulating between a gate electrode etc. and a data wiring, a drain electrode, or the like of the transistor; and a barrier layer that is formed on an upper surface or lower surface of the planari
7537972 Semiconductor device and method of manufacturing the same May 26, 2009
The present invention provides the structure and manufacturing method of a semiconductor device that consumes small power even when a screen is made to be larger. A signal wiring line or a part of a gate wiring line is formed from a low resistant material (typically aluminum) and p-chann
7511303 Semiconductor device and method of manufacturing same March 31, 2009
A semiconductor device with high reliability and operation performance is manufactured without increasing the number of manufacture steps. A gate electrode has a laminate structure. A TFT having a low concentration impurity region that overlaps the gate electrode or a TFT having a low
7501671 Semiconductor device and method of manufacturing the same March 10, 2009
The present invention is characterized in that a semiconductor film containing a rare gas element is formed on a crystalline semiconductor film obtained by using a catalytic element via a barrier layer, and the catalytic element is moved from the crystalline semiconductor film to the
7465677 Semiconductor device and method for manufacturing the same December 16, 2008
A manufacturing method of a semiconductor device of the present invention includes the steps of forming a first insulating film over a substrate, forming a semiconductor film over the first insulating film, oxidizing or nitriding the semiconductor film by conducting a plasma treatment to
7442963 Light emitting apparatus and method for manufacturing the same October 28, 2008
The purpose of the invention is to improve reliability of a light emitting apparatus comprising TFTs and organic light emitting elements. The light emitting apparatus according to the invention having thin film transistors and light emitting elements, comprises; a second inorganic in
7432529 Light emitting apparatus and method for manufacturing the same October 7, 2008
The purpose of the invention is to improve reliability of a light emitting apparatus comprising a TFT and organic light emitting elements.
7417249 Semiconductor device having a wiring including an aluminum carbon alloy and titanium or molybden August 26, 2008
According to the present invention, wirings, electrodes or the like formed from two films (an ITO film and an aluminum film) which are incompatible with each other are connected, and low power consumption is realized even if a display screen size is increased in an active matrix display
7403238 Electrooptical device, method of manufacturing the same, and electronic equipment July 22, 2008
An AMLCD having high fineness and high contrast is realized. First, an interlayer film is provided on an element electrode, and an opening portion is formed in the interlayer film. Next, after a first metal layer is formed, an embedded insulating layer is formed. The embedded insulat
7391055 Capacitor, semiconductor device and manufacturing method thereof June 24, 2008
A highly reliable capacitor, a semiconductor device having high operating performance and reliability, and a manufacturing method thereof are provided. A capacitor formed of a first conductive film 102, a dielectric 103 made of an insulating material, and a second conductive film 104 is
7355205 Light emitting apparatus and method for manufacturing the same April 8, 2008
The purpose of the invention is to improve reliability of a light emitting apparatus comprising a TFT and organic light emitting elements.The light emitting apparatus according to the invention having a thin film transistor and a light emitting element, comprises; a first inorganic i
7330234 Semiconductor device February 12, 2008
A highly reliable capacitor, a semiconductor device having high operating performance and reliability, and a manufacturing method thereof are provided. A capacitor formed of a first conductive film 102, a dielectric 103 made of an insulating material, and a second conductive film 104 is
7314774 Semiconductor device and method of manufacturing the same January 1, 2008
In manufacturing a semiconductor device, static electricity is generated while contact holes are formed in an interlayer insulating film by dry etching. Damage to a pixel region or a driving circuit region due to travel of the static electricity generated is prevented. Gate signal li
7227603 Liquid-crystal electro-optical apparatus and method of manufacturing the same June 5, 2007
A liquid crystal device comprising: a pair of substrates having an electrode arrangement thereon; an orientation control means provided on at least one of said substrates; and a ferroelectric or antiferroelectric liquid crystal layer interposed between said substrates, said liquid
7202497 Semiconductor device April 10, 2007
A semiconductor device and a process for producing the same, the semiconductor device comprising two conductive layers provided as separate layers, and an insulating layer sandwiched by the two conductive layers, in which the two conductive layers are electrically connected to each o
7198992 Method of manufacturing a semiconductor device comprising doping steps using gate electrodes and April 3, 2007
The present invention is characterized in that a semiconductor film containing a rare gas element is formed on a crystalline semiconductor film obtained by using a catalytic element via a barrier layer, and the catalytic element is moved from the crystalline semiconductor film to the
7192865 Semiconductor device and process for producing the same March 20, 2007
A semiconductor device and a process for producing the same, the semiconductor device comprising two conductive layers provided as separate layers, and an insulating layer sandwiched by the two conductive layers, in which the two conductive layers are electrically connected to each o
7183144 Semiconductor device and method of manufacturing the same February 27, 2007
According to the present invention, a pixel TFT (an n-channel TFT) having a considerably low OFF current value and a high ratio of an ON current value to an OFF current value can be realized. In a pixel portion, an electrode having a taper portion with a width of 1 .mu.m or more is f
7173283 Semiconductor device and method of manufacturing the same February 6, 2007
A semiconductor device with high reliability and operation performance is manufactured without increasing the number of manufacture steps. A gate electrode has a laminate structure. A TFT having a low concentration impurity region that overlaps the gate electrode or a TFT having a low
7161176 Electroluminescence display device having a semiconductor substrate January 9, 2007
There is provided an active matrix type display device in which the display device is formed of a driver circuit with an insulated gate FET capable of operating at high speed, and even if an area of a pixel electrode per unit pixel is made small, sufficient storage capacitance can be
7148510 Electronic apparatus having a protective circuit December 12, 2006
A semiconductor display device with an interlayer insulating film in which surface levelness is ensured with a limited film formation time, heat treatment for removing moisture does not take long, and moisture in the interlayer insulating film is prevented from escaping into a film or
7129523 Light-emitting device October 31, 2006
The reliability of a light-emitting device constituted by a combination of a TFT and a light-emitting element is to be improved. A light-emitting element is formed between a first substrate and a second substrate. The light-emitting device is formed over a first insulating layer made of
7126661 In-plane switching display device having common electrode overlapping channel forming region, an October 24, 2006
A method of forming a storage capacitor in an IPS liquid crystal display device is proposed, and a technique of forming a pixel region having a high aperture ratio is provided. An anodic oxidation process at an applied voltage/voltage supply time ratio of 11 V/min is performed for in
7067845 Semiconductor device and method of manufacturing the same June 27, 2006
In manufacturing a semiconductor device, static electricity is generated while contact holes are formed in an interlayer insulating film by dry etching. Damage to a pixel region or a driving circuit region due to travel of the static electricity generated is prevented. Gate signal li
7042024 Light emitting apparatus and method for manufacturing the same May 9, 2006
The purpose of the invention is to improve reliability of a light emitting apparatus comprising TFTs and organic light emitting elements. The light emitting apparatus according to the invention having thin film transistors and light emitting elements, comprises; a second inorganic in
7033848 Light emitting device and method of manufacturing the same April 25, 2006
A light emitting device is provided which has a structure for preventing degradation of a light emitting element due to water and oxygen contained in an interlayer insulating film formed between a TFT and the light emitting element. A TFT is formed on a substrate, an inorganic insulating
6950168 Semiconductor device with capacitor formed around contact hole September 27, 2005
A method of forming a storage capacitor in an IPS liquid crystal display device is proposed, and a technique of forming a pixel region having a high aperture ratio is provided. An anodic oxidation process at an applied voltage/voltage supply time ratio of 11 V/min is performed for insula
6929986 Semiconductor device, display device, and method of manufacturing the same August 16, 2005
In order to eliminate the disconnection of a pixel electrode caused by a change in shape of an interlayer insulating film at the ends of metal wiring, a resin film is formed at the ends of the metal wiring. Because of the resin film at the ends of the metal wiring, the step difference of
6913956 Semiconductor device and method of manufacturing the same July 5, 2005
The present invention is characterized in that a semiconductor film containing a rare gas element is formed on a crystalline semiconductor film obtained by using a catalytic element via a barrier layer, and the catalytic element is moved from the crystalline semiconductor film to the
6900460 Semiconductor device and method of manufacturing the same May 31, 2005
The present invention provides the structure and manufacturing method of a semiconductor device that consumes small power even when a screen is made to be larger. A signal wiring line or a part of a gate wiring line is formed from a low resistant material (typically aluminum) and p-chann
6884664 Semiconductor device and method of manufacturing the same April 26, 2005
According to the present invention, a pixel TFT (an n-channel TFT) having a considerably low OFF current value and a high ratio of an ON current value to an OFF current value can be realized. In a pixel portion, an electrode having a taper portion with a width of 1 .mu.m or more is forme
6861710 Light emitting device and method of manufacturing the same March 1, 2005
A light emitting device is provided which has a structure for preventing degradation of a light emitting element due to water and oxygen contained in an interlayer insulating film formed between a TFT and the light emitting element. A TFT is formed on a substrate, an inorganic insulating
6861670 Semiconductor device having multi-layer wiring March 1, 2005
The object is to pattern extremely fine integrated circuits by forming fine contact holes. The dry etching method is employed to form contact holes to pattern a wiring (114), using a mask made of metallic film (112) and an organic material as an inter-layer insulating film (111) for cove
6856360 Electrooptical device, method of manufacturing the same, and electronic equipment February 15, 2005
An AMLCD having high fineness and high contrast is realized. First, an interlayer film is provided on an element electrode, and an opening portion is formed in the interlayer film. Next, after a first metal layer is formed, an embedded insulating layer is formed. The embedded insulating
6828586 Semiconductor device and method of manufacturing the same December 7, 2004
A semiconductor device with high reliability and operation performance is manufactured without increasing the number of manufacture steps. A gale electrode has a laminate structure. A TFT having a low concentration impurity region that overlaps the gate electrode or a TFT having a low
6822264 Light emitting device November 23, 2004
The reliability of a light-emitting device constituted by a combination of a TFT and a light-emitting element is to be improved. A light-emitting element is formed between a first substrate and a second substrate. The light-emitting device is formed over a first insulating layer made of
6777716 Semiconductor display device and method of manufacturing therefor August 17, 2004
In an active matrix type liquid crystal display device, in which functional circuits such as a shift register circuit and a buffer circuit are incorporated on the same substrate, an optimal TFT structure is provided along with the aperture ratio of a pixel matrix circuit is increased.
6713323 Semiconductor device and method of manufacturing the same March 30, 2004
A semiconductor device is manufactured by a method in which the number of heat treatments at a high temperature (600.degree. C. or higher) is reduced to thereby achieve a process at a low temperature (600.degree. C. or lower), and a simplified process and improvement in throughput are
6707068 Semiconductor device and method of manufacturing the same March 16, 2004
A semiconductor device with high reliability and operation performance is manufactured without increasing the number of manufacture steps. A gate electrode has a laminate structure. A TFT having a low concentration impurity region that overlaps the gate electrode or a TFT having a low
6690434 Active matrix liquid crystal display device February 10, 2004
An active matrix liquid crystal display device capable of good quality image display is provided by disposing a shielding film on the active matrix substrate side and a shielding film on the opposing substrate side as overlapped. The active matrix liquid crystal display device is cha
6690034 Light emitting device February 10, 2004
There is provided a light emitting device including a TFT having a high driving capacity (on current) and high reliability in a driver circuit and a TFT in which an off current is reduced in a pixel portion. In manufacturing the TFTs, after the TFT having an LDD region is formed, a p
6686605 Semiconductor device, display device, and method of manufacturing the same February 3, 2004
In order to eliminate the disconnection of a pixel electrode caused by a change in shape of an interlayer insulating film at the ends of metal wiring, a resin film is formed at the ends of the metal wiring. Because of the resin film at the ends of the metal wiring, the step difference of
6677613 Semiconductor device and method of fabricating the same January 13, 2004
There is provided an active matrix type display device in which the display device is formed of a driver circuit with an insulated gate FET capable of operating at high speed, and even if an area of a pixel electrode per unit pixel is made small, sufficient storage capacitance can be obt
6630977 Semiconductor device with capacitor formed around contact hole October 7, 2003
A method of forming a storage capacitor in an IPS liquid crystal display device is proposed, and a technique of forming a pixel region having a high aperture ratio is provided. An anodic oxidation process at an applied voltage/voltage supply time ratio of 11 V/min is performed for insula
6613620 Semiconductor device and method of manufacturing the same September 2, 2003
A semiconductor device with high reliability and operation performance is manufactured without increasing the number of manufacture steps. A gate electrode has a laminate structure. A TFT having a low concentration impurity region that overlaps the gate electrode or a TFT having a low
6576926 Semiconductor device and fabrication method thereof June 10, 2003
This invention provides a semiconductor device having high operation performance and high reliability. An LDD region 707 overlapping with a gate wiring is arranged in an n-channel TFT 802 forming a driving circuit, and a TFT structure highly resistant to hot carrier injection is achieved
6576924 Semiconductor device having at least a pixel unit and a driver circuit unit over a same substrat June 10, 2003
A semiconductor device in which TFTs of suitable structures are arranged depending upon the performances of the circuits, and storage capacitors are formed occupying small areas, the semiconductor device featuring high performance and bright image. The thickness of the gate-insulating fi
6531993 Active matrix type display device March 11, 2003
An active matrix type display device comprising: a substrate; a plurality of source signal lines and a plurality of gate signal lines formed over the substrate; a plurality of pixel TFTs formed over the substrate; a plurality of pixel electrodes electrically connected to said plurali
5976988 Etching material and etching method November 2, 1999
An alumina film, a silicon oxide film, and a silicon nitride film formed on a substrate containing a large amount of alumina are etched by using an etching material in which the concentration of ammonium fluoride, which is a component of BHF, is set low. Etching is performed by using an
5818557 Liquid-crystal electro-optical apparatus and method of manufacturing the same October 6, 1998
A liquid crystal device comprising:a pair of substrates having an electrode arrangement thereon;an orientation control means provided on at least one of said substrates; anda ferroelectric or antiferroelectric liquid crystal layer interposed between said substrates, said liquid crystal layer
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