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Browse by: INVENTOR PATENT HOLDER PATENT NUMBER DATE
 
 
Inventor:
Marshall; John D
Address:
Boise, ID
No. of patents:
7
Patents:












Patent Number Title Of Patent Date Issued
8566660 Built-in-self-test using embedded memory and processor in an application specific integrated cir October 22, 2013
A test method for an ASIC uses an embedded processor in the ASIC to execute test routines from an embedded memory or an external memory. During ASIC production, the test routines can comprehensively test of the blocks of the ASIC without a complicated test pattern from test equipment
8046652 Built-in self-test using embedded memory and processor in an application specific integrated cir October 25, 2011
A test method for an ASIC uses an embedded processor in the ASIC to execute test routines from an embedded memory or an external memory. During ASIC production, the test routines can comprehensively test of the blocks of the ASIC without a complicated test pattern from test equipment
8045212 Laser print apparatus that generates pulse with value and justification value based on pixels in October 25, 2011
A laser print apparatus includes a memory for storing a multi-bit image including a plurality of pixels. Each pixel is represented by an N-bit value, wherein N is greater than one. A modulation code generator analyzes three adjacent pixels. The three adjacent pixels include a left pi
7890828 Built-in self-test using embedded memory and processor in an application specific integrated cir February 15, 2011
A test method for an ASIC uses an embedded processor in the ASIC to execute test routines from an embedded memory or an external memory. During ASIC production, the test routines can comprehensively test of the blocks of the ASIC without a complicated test pattern from test equipment
7609409 Laser print apparatus that generates pulse width value and justification value based on pixels i October 27, 2009
A laser print apparatus includes a memory for storing a multi-bit image including a plurality of pixels. Each pixel is represented by an N-bit value, wherein N is greater than one. A modulation code generator analyzes three adjacent pixels. The three adjacent pixels include a left pi
7418642 Built-in-self-test using embedded memory and processor in an application specific integrated cir August 26, 2008
A test method for an ASIC uses an embedded processor in the ASIC to execute test routines from an embedded memory or an external memory. During ASIC production, the test routines can comprehensively test of the blocks of the ASIC without a complicated test pattern from test equipment
7280246 Laser print apparatus that generates pulse width value and justification value based on pixels i October 9, 2007
A laser print apparatus includes a memory for storing a multi-bit image including a plurality of pixels. Each pixel is represented by an N-bit value, wherein N is greater than one. A modulation code generator analyzes three adjacent pixels. The three adjacent pixels include a left pi










 
 
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